Mitch Aigner

	1997
2		Mitch Aigner: Embedded At-Speed Test Probe. ITC 1997: 932-937
	1995
1		A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey: Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. ITC 1995: 328-335

Coauthor Index

1	T. Almy	[1]
2	A. Frisch	[1]
3	Hans J. Greub	[1]
4	M. Hazra	[1]
5	S. Mohr	[1]
6	Nicholas J. Naclerio	[1]
7	W. Russell	[1]
8	M. Stebniskey	[1]

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