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| 2011 | ||
|---|---|---|
| 1 | Ru Huang, Runsheng Wang, Jing Zhuge, Changze Liu, Tao Yu, Liangliang Zhang, Xin Huang, Yujie Ai, Jinbin Zou, Yuchao Liu, Jiewen Fan, Huailin Liao, Yangyuan Wang: Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling. CICC 2011: 1-8 | |
| 1 | Jiewen Fan | [1] |
| 2 | Ru Huang | [1] |
| 3 | Xin Huang | [1] |
| 4 | Huailin Liao | [1] |
| 5 | Changze Liu | [1] |
| 6 | Yuchao Liu | [1] |
| 7 | Runsheng Wang | [1] |
| 8 | Yangyuan Wang | [1] |
| 9 | Tao Yu | [1] |
| 10 | Liangliang Zhang | [1] |
| 11 | Jing Zhuge | [1] |
| 12 | Jinbin Zou | [1] |
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