 | 2011 |
| 13 |  | Geert Van der Plas,
Paresh Limaye,
Igor Loi,
Abdelkarim Mercha,
Herman Oprins,
Cristina Torregiani,
Steven Thijs,
Dimitri Linten,
Michele Stucchi,
Guruprasad Katti,
Dimitrios Velenis,
Vladimir Cherman,
Bart Vandevelde,
Veerle Simons,
Ingrid De Wolf,
Riet Labie,
Dan Perry,
Stephane Bronckers,
Nikolaos Minas,
Miro Cupac,
Wouter Ruythooren,
Jan Van Olmen,
Alain Phommahaxay,
Muriel de Potter de ten Broeck,
Ann Opdebeeck,
Michal Rakowski,
Bart De Wachter,
Morin Dehan,
Marc Nelis,
Rahul Agarwal,
Antonio Pullini,
Federico Angiolini,
Luca Benini,
Wim Dehaene,
Youssef Travaly,
Eric Beyne,
Paul Marchal:
Design Issues and Considerations for Low-Cost 3-D TSV IC Technology.
J. Solid-State Circuits 46(1): 293-307 (2011) |
| 2010 |
| 12 |  | Geert Van der Plas,
Steven Thijs,
Dimitri Linten,
Guruprasad Katti,
Paresh Limaye,
Abdelkarim Mercha,
Michele Stucchi,
Herman Oprins,
Bart Vandevelde,
Nikolaos Minas,
Miro Cupac,
Morin Dehan,
Marc Nelis,
Rahul Agarwal,
Wim Dehaene,
Youssef Travaly,
Eric Beyne,
Paul Marchal:
Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack - Challenges and solutions.
CICC 2010: 1-4 |
| 11 |  | Geert Van der Plas,
Paresh Limaye,
Abdelkarim Mercha,
Herman Oprins,
Cristina Torregiani,
Steven Thijs,
Dimitri Linten,
Michele Stucchi,
Guruprasad Katti,
Dimitrios Velenis,
Domae Shinichi,
Vladimir Cherman,
Bart Vandevelde,
Veerle Simons,
Ingrid De Wolf,
Riet Labie,
Dan Perry,
Stephane Bronckers,
Nikolaos Minas,
Miro Cupac,
Wouter Ruythooren,
Jan Van Olmen,
Alain Phommahaxay,
Muriel de Potter de ten Broeck,
Ann Opdebeeck,
Michal Rakowski,
Bart De Wachter,
Morin Dehan,
Marc Nelis,
Rahul Agarwal,
Wim Dehaene,
Youssef Travaly,
Pol Marchal,
Eric Beyne:
Design issues and considerations for low-cost 3D TSV IC technology.
ISSCC 2010: 148-149 |
| 10 |  | Rahul Agarwal,
Saddek Bensalem,
Eitan Farchi,
Klaus Havelund,
Yarden Nir-Buchbinder,
Scott D. Stoller,
Shmuel Ur,
Liqiang Wang:
Detection of deadlock potentials in multithreaded programs.
IBM Journal of Research and Development 54(5): 3 (2010) |
| 2009 |
| 9 |  | Yann Civale,
Deniz Sabuncuoglu Tezcan,
Harold G. G. Philipsen,
P. Jaenen,
Rahul Agarwal,
F. Duval,
Philippe Soussan,
Youssef Travaly,
Eric Beyne:
Die stacking using 3D-wafer level packaging copper/polymer through-si via technology and Cu/Sn interconnect bumping.
3DIC 2009: 1-4 |
| 2006 |
| 8 |  | Rahul Agarwal,
Scott D. Stoller:
Run-time detection of potential deadlocks for programs with locks, semaphores, and condition variables.
PADTAD 2006: 51-60 |
| 7 |  | Rahul Agarwal,
Stephen H. Edwards,
Manuel A. Pérez-Quiñones:
Designing an adaptive learning module to teach software testing.
SIGCSE 2006: 259-263 |
| 2005 |
| 6 |  | Rahul Agarwal,
Amit Sasturkar,
Liqiang Wang,
Scott D. Stoller:
Optimized run-time race detection and atomicity checking using partial discovered types.
ASE 2005: 233-242 |
| 5 |  | Rahul Agarwal,
Liqiang Wang,
Scott D. Stoller:
Detecting Potential Deadlocks with Static Analysis and Run-Time Monitoring.
Haifa Verification Conference 2005: 191-207 |
| 4 |  | Rahul Agarwal,
Mahender Bisht,
S. N. Maheshwari,
Sanjiva Prasad:
Divide and Concur: Employing Chandra and Toueg's Consensus Algorithm in a Multi-level Setting.
ICDCIT 2005: 172-183 |
| 3 |  | Scott Samson,
Rahul Agarwal,
Sunny Kedia,
Weidong Wang,
Shinzo Onishi,
John Bumgarner:
Fabrication Processes for Packaged Optical MEMS Devices.
ICMENS 2005: 113-120 |
| 2 |  | Amit Sasturkar,
Rahul Agarwal,
Liqiang Wang,
Scott D. Stoller:
Automated type-based analysis of data races and atomicity.
PPOPP 2005: 83-94 |
| 2004 |
| 1 |  | Rahul Agarwal,
Scott D. Stoller:
Type Inference for Parameterized Race-Free Java.
VMCAI 2004: 149-160 |