Mridul Agarwal

	2008
5		Mridul Agarwal, Varsha Balakrishnan, Anshuman Bhuyan, Kyunglok Kim, Bipul C. Paul, Wenping Wang, Bo Yang, Yu Cao, Subhasish Mitra: Optimized Circuit Failure Prediction for Aging: Practicality and Promise. ITC 2008: 1-10
	2007
4		Subhasish Mitra, Mridul Agarwal: Circuit failure prediction to overcome scaled CMOS reliability challenges. ITC 2007: 1-3
3		Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra: Circuit Failure Prediction and Its Application to Transistor Aging. VTS 2007: 277-286
	2006
2		Kanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw: Statistical interconnect metrics for physical-design optimization. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1273-1288 (2006)
	2005
1		Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw: Statistical modeling of cross-coupling effects in VLSI interconnects. ASP-DAC 2005: 503-506

Coauthor Index

1	Kanak Agarwal	[1] [2]
2	Varsha Balakrishnan	[5]
3	Anshuman Bhuyan	[5]
4	David Blaauw (David T. Blaauw)	[1] [2]
5	Yu Cao	[5]
6	Kyunglok Kim	[5]
7	Subhasish Mitra	[3] [4] [5]
8	Bipul Chandra Paul (Bipul C. Paul)	[3] [5]
9	Dennis Sylvester	[1] [2]
10	Wenping Wang	[5]
11	Bo Yang	[5]
12	Ming Zhang	[3]

Last update Sat May 26 04:23:17 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page