Jan Ackaert

	2008
3		Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, A. Vlad, Jean-Pierre Raskin: MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. Microelectronics Reliability 48(8-9): 1553-1556 (2008)
	2003
2		Jan Ackaert, Klara Bessemans, Eddy De Backer: Charging induced damage by photoconduction through thick inter metal dielectrics. Microelectronics Reliability 43(9-11): 1525-1529 (2003)
	2001
1		Jan Ackaert, Z. Wang, Eddy De Backer, P. Colson, Peter Coppens: Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. Microelectronics Reliability 41(9-10): 1403-1407 (2001)

Coauthor Index

1	Eddy De Backer	[1] [2] [3]
2	Klara Bessemans	[2]
3	P. Bogaert	[3]
4	R. Charavel	[3]
5	P. Colson	[1]
6	Peter Coppens	[1]
7	K. Dhondt	[3]
8	A. Iline	[3]
9	M. Millecam	[3]
10	Jean-Pierre Raskin	[3]
11	Luc De Schepper	[3]
12	E. Vandevelde	[3]
13	B. Vlachakis	[3]
14	A. Vlad	[3]
15	Z. Wang	[1]

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