 | 2011 |
| 13 |  | Jim Aarestad,
Charles Lamech,
Jim Plusquellic,
Dhruva Acharyya,
Kanak Agarwal:
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect.
DAC 2011: 534-539 |
| 12 |  | Jim Plusquellic,
Dhruva Acharyya,
Kanak Agarwal:
Measuring within-die spatial variation profile through power supply current measurements.
ISQED 2011: 711-715 |
| 11 |  | Dhruva Acharyya,
Kosuke Miyao,
David Ting,
Daniel Lam,
Robert Smith,
Pete Fitzpatrick,
Brian Buras,
John Williamson:
Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current.
ITC 2011: 1-10 |
| 2010 |
| 10 |  | Ryan Helinski,
Dhruva Acharyya,
Jim Plusquellic:
Quality metric evaluation of a physical unclonable function derived from an IC's power distribution system.
DAC 2010: 240-243 |
| 9 |  | Dhruva Acharyya,
Kanak Agarwal,
Jim Plusquellic:
Leveraging existing power control circuits and power delivery architecture for variability measurement.
ITC 2010: 645-653 |
| 8 |  | Jim Aarestad,
Dhruva Acharyya,
Reza M. Rad,
Jim Plusquellic:
Detecting Trojans Through Leakage Current Analysis Using Multiple Supply Pad IDDQ s.
IEEE Transactions on Information Forensics and Security 5(4): 893-904 (2010) |
| 2009 |
| 7 |  | Ryan Helinski,
Dhruva Acharyya,
Jim Plusquellic:
A physical unclonable function defined using power distribution system equivalent resistance variations.
DAC 2009: 676-681 |
| 6 |  | Kanak Agarwal,
Dhruva Acharyya,
Jim Plusquellic:
Characterizing within-die variation from multiple supply port IDDQ measurements.
ICCAD 2009: 418-424 |
| 2007 |
| 5 |  | Rouwaida Kanj,
Rajiv V. Joshi,
Jayakumaran Sivagnaname,
Jente B. Kuang,
Dhruva Acharyya,
Tuyet Nguyen,
Chandler McDowell,
Sani R. Nassif:
Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs.
ISQED 2007: 33-40 |
| 2006 |
| 4 |  | Jim Plusquellic,
Dhruva Acharyya,
Abhishek Singh,
Mohammad Tehranipoor,
Chintan Patel:
Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method.
IEEE Design & Test of Computers 23(4): 278-293 (2006) |
| 2005 |
| 3 |  | Dhruva Acharyya,
Jim Plusquellic:
Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements.
VTS 2005: 433-438 |
| 2003 |
| 2 |  | Dhruva Acharyya,
Jim Plusquellic:
Impedance Profile of a Commercial Power Grid and Test System.
ITC 2003: 709-718 |
| 1 |  | Chintan Patel,
Ernesto Staroswiecki,
Smita Pawar,
Dhruva Acharyya,
Jim Plusquellic:
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids.
J. Electronic Testing 19(6): 611-623 (2003) |