 | 2011 |
|---|
| 7 |       | Mohamed H. Abu-Rahma,
Ying Chen,
Wing Sy,
Wee Ling Ong,
Leon Yeow Ting,
Sei Seung Yoon,
Michael Han,
Esin Terzioglu:
Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS.
CICC 2011: 1-4 |
| 6 | | Rajamani Sethuram,
Karim Arabi,
Mohamed H. Abu-Rahma:
Leakage power profiling and leakage power reduction using DFT hardware.
VTS 2011: 46-51 |
| 2010 |
|---|
| 5 | | Mohamed H. Abu-Rahma,
Mohab Anis,
Sei Seung Yoon:
Reducing SRAM Power Using Fine-Grained Wordline Pulsewidth Control.
IEEE Trans. VLSI Syst. 18(3): 356-364 (2010) |
| 2008 |
|---|
| 4 | | Mohamed H. Abu-Rahma,
Kinshuk Chowdhury,
Joseph Wang,
Zhiqin Chen,
Sei Seung Yoon,
Mohab Anis:
A methodology for statistical estimation of read access yield in SRAMs.
DAC 2008: 205-210 |
| 3 | | Mohamed H. Abu-Rahma,
Mohab Anis:
A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 1983-1995 (2008) |
| 2007 |
|---|
| 2 | | Mohamed H. Abu-Rahma,
Mohab Anis:
Variability in VLSI Circuits: Sources and Design Considerations.
ISCAS 2007: 3215-3218 |
| 2005 |
|---|
| 1 | | Mohab Anis,
Mohamed H. Abu-Rahma:
Leakage Current Variability in Nanometer Technologies, invited.
IWSOC 2005: 60-63 |
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