Miron Abramovici

	2010
74		Amir Nahir, Avi Ziv, Rajesh Galivanche, Alan J. Hu, Miron Abramovici, Albert Camilleri, Bob Bentley, Harry Foster, Valeria Bertacco, Shakti Kapoor: Bridging pre-silicon verification and post-silicon validation. DAC 2010: 94-95
	2009
73		Miron Abramovici, Al Crouch: We need more standards like IEEE 1500. IEEE Design & Test of Computers 26(1): 104 (2009)
	2008
72		Miron Abramovici, Kees Goossens, Bart Vermeulen, Jack Greenbaum, Neal Stollon, Adam Donlin: You can catch more bugs with transaction level honey. CODES+ISSS 2008: 121-124
71		Miron Abramovici: In-System Silicon Validation and Debug. IEEE Design & Test of Computers 25(3): 216-223 (2008)
	2007
70		John M. Emmert, Charles E. Stroud, Miron Abramovici: Online Fault Tolerance for FPGA Logic Blocks. IEEE Trans. VLSI Syst. 15(2): 216-226 (2007)
	2006
69		Miron Abramovici, Paul Bradley, Kumar N. Dwarakanath, Peter Levin, Gérard Memmi, Dave Miller: A reconfigurable design-for-debug infrastructure for SoCs. DAC 2006: 7-12
	2005
68		Xiaoming Yu, Miron Abramovici: Sequential circuit ATPG using combinational algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 24(8): 1294-1310 (2005)
	2004
67		Miron Abramovici, Charles E. Stroud, John M. Emmert: Online BIST and BIST-based diagnosis of FPGA logic blocks. IEEE Trans. VLSI Syst. 12(12): 1284-1294 (2004)
	2003
66		Miron Abramovici, Charles E. Stroud: BIST-Based Delay-Fault Testing in FPGAs. J. Electronic Testing 19(5): 549-558 (2003)
	2002
65		Miron Abramovici, Xiaoming Yu, Elizabeth M. Rudnick: Low-cost sequential ATPG with clock-control DFT. DAC 2002: 243-248
64		Miron Abramovici, Charles E. Stroud, Marty Emmert: Using embedded FPGAs for SoC yield improvement. DAC 2002: 713-724
63		Miron Abramovici, Charles E. Stroud: BIST-Based Delay-Fault Testing in FPGAs. IOLTW 2002: 131-134
62		Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici: BIST-Based Diagnosis of FPGA Interconnect. ITC 2002: 618-627
	2001
61		John M. Emmert, Stanley Baumgart, Pankaj Kataria, Andrew M. Taylor, Charles E. Stroud, Miron Abramovici: On-Line Fault Tolerance for FPGA Interconnect with Roving STARs. DFT 2001: 445-454
60		Miron Abramovici, John M. Emmert, Charles E. Stroud: Roving Stars: An Integrated Approach To On-Line Testing, Diagnosis, And Fault Tolerance For Fpgas In Adaptive Computing Systems. Evolvable Hardware 2001: 73-92
59		Miron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John M. Emmert: On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs. IOLTW 2001: 27-33
58		Jongshin Shin, Xiaoming Yu, Elizabeth M. Rudnick, Miron Abramovici: At-speed logic BIST using a frozen clock testing strategy. ITC 2001: 64-71
57		Miron Abramovici, Charles E. Stroud: BIST-based test and diagnosis of FPGA logic blocks. IEEE Trans. VLSI Syst. 9(1): 159-172 (2001)
	2000
56		John M. Emmert, Charles E. Stroud, Brandon Skaggs, Miron Abramovici: Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration. FCCM 2000: 165-174
55		John M. Emmert, Charles E. Stroud, Jason A. Cheatham, Andrew M. Taylor, Pankaj Kataria, Miron Abramovici: Performance Penalty for Fault Tolerance in Roving STARs. FPL 2000: 545-554
54		Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John M. Emmert: Improving On-Line BIST-Based Diagnosis for Roving STARs. IOLTW 2000: 31-39
53		Miron Abramovici, Charles E. Stroud: DIST-based detection and diagnosis of multiple faults in FPGAs. ITC 2000: 785-794
52		Qiang Peng, Miron Abramovici, Jacob Savir: MUST: multiple-stem analysis for identifying sequentially untestable faults. ITC 2000: 839-846
51		David E. Long, Mahesh A. Iyer, Miron Abramovici: FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults. ACM Trans. Design Autom. Electr. Syst. 5(3): 631-657 (2000)
50		Miron Abramovici, José T. de Sousa: A SAT Solver Using Reconfigurable Hardware and Virtual Logic. J. Autom. Reasoning 24(1/2): 5-36 (2000)
49		Elizabeth M. Rudnick, Miron Abramovici: Compact Test Generation Using a Frozen Clock Testing Strategy. J. Inf. Sci. Eng. 16(5): 703-717 (2000)
	1999
48		Miron Abramovici, José T. de Sousa, Daniel G. Saab: A Massively-Parallel Easily-Scalable Satisfiability Solver Using Reconfigurable Hardware. DAC 1999: 684-690
47		Yanti Santoso, Matthew C. Merten, Elizabeth M. Rudnick, Miron Abramovici: FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy. DATE 1999: 747-
46		Miron Abramovici, José T. de Sousa: A Virtual Logic Algorithm for Solving Satisfiability Problems Using Reconfigurable Hardware. FCCM 1999: 306-307
45		Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma: Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. ITC 1999: 973-982
	1998
44		Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici: Built-in self-test of FPGA interconnect. ITC 1998: 404-411
	1997
43		Miron Abramovici, Premachandran R. Menon: Fault simulation on reconfigurable hardware. FCCM 1997: 182-191
42		Miron Abramovici, Daniel G. Saab: Satisfiability on reconfigurable hardware. FPL 1997: 448-456
41		Charles E. Stroud, Eric Lee, Miron Abramovici: BIST-Based Diagnostics of FPGA Logic Blocks. ITC 1997: 539-547
	1996
40		Mahesh A. Iyer, David E. Long, Miron Abramovici: Identifying Sequential Redundancies Without Search. DAC 1996: 457-462
39		Charles E. Stroud, Ping Chen, Srinivasa Konala, Miron Abramovici: Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks. FPGA 1996: 107-113
38		Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici: Using ILA Testing for BIST in FPGAs. ITC 1996: 68-75
37		Krishna B. Rajan, David E. Long, Miron Abramovici: Increasing testability by clock transformation (getting rid of those darn states). VTS 1996: 224-230
36		Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici: Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!). VTS 1996: 387-392
35		Mahesh A. Iyer, Miron Abramovici: FIRE: a fault-independent combinational redundancy identification algorithm. IEEE Trans. VLSI Syst. 4(2): 295-301 (1996)
	1995
34		Prashant S. Parikh, Miron Abramovici: On Combining Design for Testability Techniques. ITC 1995: 423-429
33		David E. Long, Mahesh A. Iyer, Miron Abramovici: Identifying sequentially untestable faults using illegal states. VTS 1995: 4-11
32		Prashant S. Parikh, Miron Abramovici: Testability-based partial scan analysis. J. Electronic Testing 7(1-2): 61-70 (1995)
	1994
31		Mahesh A. Iyer, Miron Abramovici: Sequentially Untestable Faults Identified Without Search ("Simple Implications Beat Exhaustive Search!"). ITC 1994: 259-266
30		Mahesh A. Iyer, Miron Abramovici: Low-Cost Redundancy Identification for Combinatorial Circuits. VLSI Design 1994: 315-318
	1993
29		Prashant S. Parikh, Miron Abramovici: A Cost-Based Approach to Partial Scan. DAC 1993: 255-259
28		Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab: On Selecting Flip-Flops for Partial Reset. ITC 1993: 1008-1012
27		Miron Abramovici: DOs and DON'Ts in Computing Fault Coverage. ITC 1993: 594
	1992
26		Miron Abramovici, Krishna B. Rajan, David T. Miller: Freeze!: A New Approach for Testing Sequential Circuits. DAC 1992: 22-25
25		Miron Abramovici, Prashant S. Parikh: Warning: 100% Fault Coverage May Be Misleading!! ITC 1992: 662-668
24		Miron Abramovici, Mahesh A. Iyer: One-Pass Redundancy Identification and Removal. ITC 1992: 807-815
23		Miron Abramovici, David T. Miller, Rabindra K. Roy: Dynamic redundancy identification in automatic test generation. IEEE Trans. on CAD of Integrated Circuits and Systems 11(3): 404-407 (1992)
	1991
22		Miron Abramovici, James J. Kulikowski, Rabindra K. Roy: The Best Flip-Flops to Scan. ITC 1991: 166-173
21		Premachandran R. Menon, Ytzhak H. Levendel, Miron Abramovici: SCRIPT: a critical path tracing algorithm for synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 10(6): 738-747 (1991)
	1990
20		Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman: Digital systems testing and testable design. Computer Science Press 1990: I-XXI, 1-653
19		Miron Abramovici, David T. Miller, R. Henning: Global cost functions for test generation. ITC 1990: 35-43
	1988
18		Miron Abramovici, B. Krishnamurthy, A. Mathews, B. Rogers, M. Schulz, S. Seth, John A. Waicukauski: What is the Path to Fast Fault Simulation? ITC 1988: 183-192
	1986
17		Miron Abramovici, Premachandran R. Menon, David T. Miller: Checkpoint Faults are not Sufficient Target Faults for Test Generation. IEEE Trans. Computers 35(8): 769-771 (1986)
	1985
16		Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller: Test Generation In Lamp2: System Overview. ITC 1985: 45-48
15		Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller: Test Generation In Lamp2: Concepts and Algorithms. ITC 1985: 49-56
14		Miron Abramovici: Low-Cost Fault Simulation: Why, When and How. ITC 1985: 795
13		Miron Abramovici, Premachandran R. Menon: A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. IEEE Trans. Computers 34(7): 658-663 (1985)
	1983
12		Miron Abramovici, Premachandran R. Menon, David T. Miller: Critical path tracing - an alternative to fault simulation. DAC 1983: 214-220
11		Miron Abramovici, Premachandran R. Menon: A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. ITC 1983: 138-142
10		Miron Abramovici, Ytzhak H. Levendel, Premachandran R. Menon: A Logic Simulation Machine. IEEE Trans. on CAD of Integrated Circuits and Systems 2(2): 82-94 (1983)
	1982
9		Miron Abramovici, Ytzhak H. Levendel, Premachandran R. Menon: A logic simulation machine. DAC 1982: 65-73
8		Miron Abramovici, Ytzhak H. Levendel, Premachandran R. Menon: A logic simulation machine. ISCA 1982: 148-157
7		Miron Abramovici, Melvin A. Breuer: Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect-Cause Analysis. IEEE Trans. Computers 31(12): 1165-1172 (1982)
6		Miron Abramovici: A Hierarchical, Path-Oriented Approach to Fault Diagnosis in Modular Combinational Circuits. IEEE Trans. Computers 31(7): 672-677 (1982)
	1981
5		Miron Abramovici: A maximal resolution guided-probe testing algorithm. DAC 1981: 189-195
	1980
4		Miron Abramovici, Melvin A. Breuer: Fault diagnosis based on effect-cause analysis: An introduction. DAC 1980: 69-76
3		Miron Abramovici, Melvin A. Breuer: Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis. IEEE Trans. Computers 29(6): 451-460 (1980)
	1979
2		Miron Abramovici, Melvin A. Breuer: On Redundancy and Fault Detection in Sequential Circuits. IEEE Trans. Computers 28(11): 864-865 (1979)
	1977
1		Miron Abramovici, Melvin A. Breuer, K. Kumar: Concurrent fault simulation and functional level modeling. DAC 1977: 128-137

Coauthor Index

1	Stanley Baumgart	[61]
2	Bob Bentley	[74]
3	Valeria Bertacco	[74]
4	Paul Bradley	[69]
5	Melvin A. Breuer	[1] [2] [3] [4] [7] [20]
6	Albert Camilleri	[74]
7	Jason A. Cheatham	[55]
8	Ping Chen	[36] [39]
9	Alfred L. Crouch (Al Crouch)	[73]
10	Adam Donlin	[72]
11	Kumar N. Dwarakanath	[69]
12	John M. Emmert	[54] [55] [56] [59] [60] [61] [67] [70]
13	Marty Emmert	[64]
14	Harry Foster	[74]
15	Arthur D. Friedman	[20]
16	Rajesh Galivanche	[74]
17	Kees G. W. Goossens (Kees Goossens)	[72]
18	Jack Greenbaum	[72]
19	Carter Hamilton	[44] [45]
20	R. Henning	[19]
21	Alan J. Hu	[74]
22	Mahesh A. Iyer	[24] [30] [31] [33] [35] [40] [51]
23	Shakti Kapoor	[74]
24	Pankaj Kataria	[55] [61]
25	Srinivasa Konala	[36] [38] [39]
26	B. Krishnamurthy	[18]
27	James J. Kulikowski	[15] [16] [22]
28	K. Kumar	[1]
29	Matthew Lashinsky	[59] [62]
30	Eric Lee	[38] [41]
31	Ytzhak H. Levendel	[8] [9] [10] [21]
32	Peter Levin	[69]
33	David E. Long	[33] [37] [40] [51]
34	Ben Mathew	[28]
35	A. Mathews	[18]
36	Gérard Memmi	[69]
37	Premachandran R. Menon	[8] [9] [10] [11] [12] [13] [15] [16] [17] [21] [43]
38	Matthew C. Merten	[47]
39	Dave Miller	[69]
40	David T. Miller	[12] [15] [16] [17] [19] [23] [26]
41	Amir Nahir	[74]
42	Jeremy Nall	[59] [62]
43	Prashant S. Parikh	[25] [28] [29] [32] [34]
44	Qiang Peng	[52]
45	Krishna B. Rajan	[26] [37]
46	B. Rogers	[18]
47	Rabindra K. Roy	[22] [23]
48	Elizabeth M. Rudnick	[47] [49] [58] [65]
49	Daniel G. Saab	[28] [42] [48]
50	Yanti Santoso	[47]
51	Jacob Savir	[52]
52	M. Schulz	[18]
53	S. Seth	[18]
54	Jongshin Shin	[58]
55	Brandon Skaggs	[54] [56]
56	José T. de Sousa	[46] [48] [50]
57	Neal Stollon	[72]
58	Charles E. Stroud	[36] [38] [39] [41] [44] [45] [53] [54] [55] [56] [57] [59] [60] [61] [62] [63] [64] [66] [67] [70]
59	Andrew M. Taylor	[55] [61]
60	Vinay Verma	[45]
61	Bart Vermeulen	[72]
62	John A. Waicukauski	[18]
63	Sajitha Wijesuriya	[44] [45]
64	Xiaoming Yu	[58] [65] [68]
65	Avi Ziv	[74]

Colors in the list of coauthors

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