Jacob A. Abraham

	2012
315		Hyunjin Kim, Jacob A. Abraham: On-chip source synchronous interface timing test scheme with calibration. DATE 2012: 1146-1149
314		Junyoung Park, H. Mert Ustun, Jacob A. Abraham: Run-time Prediction of the Optimal Performance Point in DVS-based Dynamic Thermal Management. VLSI Design 2012: 155-160
313		Jaeyong Chung, Jacob A. Abraham: Refactoring of Timing Graphs and Its Use in Capturing Topological Correlation in SSTA. IEEE Trans. on CAD of Integrated Circuits and Systems 31(4): 485-496 (2012)
312		Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham: Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator. IEEE Trans. on CAD of Integrated Circuits and Systems 31(4): 497-508 (2012)
311		Baker Mohammad, Jacob A. Abraham: A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory. Microelectronics Journal 43(2): 110-118 (2012)
	2011
310		Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham: Path criticality computation in parameterized statistical timing analysis. ASP-DAC 2011: 249-254
309		Joonsoo Kim, Joonsoo Lee, Jacob A. Abraham: System accuracy estimation of SRAM-based device authentication. ASP-DAC 2011: 37-42
308		Tung-Yeh Wu, Shih-Hsin Hu, Jacob A. Abraham: Robust power gating reactivation by dynamic wakeup sequence throttling. ASP-DAC 2011: 615-620
307		Hyunjin Kim, Jacob A. Abraham: On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test. Asian Test Symposium 2011: 15-20
306		Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham: Post-Silicon Timing Validation Method Using Path Delay Measurements. Asian Test Symposium 2011: 232-237
305		Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham: Testability driven statistical path selection. DAC 2011: 417-422
304		Junyoung Park, Jacob A. Abraham: A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems. ISLPED 2011: 391-396
303		Jacob A. Abraham: Tutorial: "Manufacturing test of systems-on-a-chip (SoCs)". SoCC 2011: 272
302		Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham: Efficient and product-representative timing model validation. VTS 2011: 90-95
301		Byoungho Kim, Jacob A. Abraham: Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications. IEEE T. Instrumentation and Measurement 60(6): 2014-2024 (2011)
300		Ramtilak Vemu, Jacob A. Abraham: CEDA: Control-Flow Error Detection Using Assertions. IEEE Trans. Computers 60(9): 1233-1245 (2011)
299		Byoungho Kim, Jacob A. Abraham: Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. IEEE Trans. on Circuits and Systems 58-I(8): 1773-1784 (2011)
298		Joonsung Park, Hongjoong Shin, Jacob A. Abraham: Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electronic Testing 27(3): 321-334 (2011)
297		Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham: Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electronic Testing 27(4): 429-439 (2011)
	2010
296		Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham: A delay measurement method using a shrinking clock signal. ACM Great Lakes Symposium on VLSI 2010: 139-142
295		Ji Hwan (Paul) Chun, Jae Wook Lee, Jacob A. Abraham: A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. ASP-DAC 2010: 312-317
294		Hyunjin Kim, Jacob A. Abraham: A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous Memory Interfaces. Asian Test Symposium 2010: 123-128
293		Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh: At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium 2010: 269-274
292		Sachin Dileep Dasnurkar, Jacob A. Abraham: Calibration-enabled scalable built-in current sensor compatible with very low cost ATE. European Test Symposium 2010: 119-124
291		Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo: A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. European Test Symposium 2010: 145-150
290		Joonsoo Kim, Joonsoo Lee, Jacob A. Abraham: Toward reliable SRAM-based device identification. ICCD 2010: 313-320
289		Sachin Dileep Dasnurkar, Jacob A. Abraham: Real-time dynamic hybrid BiST solution for Very-Low-Cost ATE production testing of A/D converters with controlled DPPM. ISQED 2010: 562-569
288		Tung-Yeh Wu, Sriram Sambamurthy, Jacob A. Abraham: Estimation of maximum application-level power supply noise. SoCC 2010: 213-218
287		Shakeel S. Abdulla, Haewoon Nam, Earl E. Swartzlander Jr., Jacob A. Abraham: High speed recursion-free CORDIC architecture. SoCC 2010: 65-70
286		Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo: Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. VTS 2010: 33-38
285		Mohamad A. Zeidan, Aritra Banerjee, Ranjit Gharpurey, Jacob A. Abraham: Multitone digital signal based test for RF receivers. VTS 2010: 343-348
284		Hongjoong Shin, Joonsung Park, Jacob A. Abraham: Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. J. Electronic Testing 26(1): 73-86 (2010)
283		Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham: On-Chip Delay Measurement Based Response Analysis for Timing Characterization. J. Electronic Testing 26(6): 599-619 (2010)
	2009
282		Joonsung Park, Jaeyong Chung, Jacob A. Abraham: LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits. Asian Test Symposium 2009: 373-378
281		Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham: A Random Jitter RMS Estimation Technique for BIST Applications. Asian Test Symposium 2009: 9-14
280		Shih-Hsin Hu, Tung-Yeh Wu, Jacob A. Abraham: SNR-Aware Error Detection for Low-Power Discrete Wavelet Lifting Transform in JPEG 2000. DFT 2009: 136-144
279		Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh: Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. European Test Symposium 2009: 129-134
278		Rajeshwary Tayade, Jacob A. Abraham: Critical Path Selection for Delay Test Considering Coupling Noise. European Test Symposium 2009: 163-168
277		Jaeyong Chung, Jacob A. Abraham: A hierarchy of subgraphs underlying a timing graph and its use in capturing topological correlation in SSTA. ICCAD 2009: 321-327
276		Shakeel S. Abdulla, Haewoon Nam, Mark McDermot, Jacob A. Abraham: A high throughput FFT processor with no multipliers. ICCD 2009: 485-490
275		Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Chris Papachristou: Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. IOLTS 2009: 129
274		Shih-Hsin Hu, Jacob A. Abraham: Error detection in 2-D Discrete Wavelet lifting transforms. IOLTS 2009: 170-175
273		Tung-Yeh Wu, Samaneh Gharahi, Jacob A. Abraham: An Area Efficient On-chip Static IR Drop Detector/Evaluator. ISCAS 2009: 2009-2012
272		Sachin Dileep Dasnurkar, Jacob A. Abraham: Hybrid BiST Solution for Analog to Digital Converters with Low-cost Automatic Test Equipment Compatibility. ISCAS 2009: 9-12
271		Savithri Sundareswaran, Rajendran Panda, Jacob A. Abraham, Yun Zhang, Amit Mittal: Characterization of sequential cells for constraint sensitivities. ISQED 2009: 74-79
270		Sriram Sambamurthy, Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham: Functionally valid gate-level peak power estimation for processors. ISQED 2009: 753-758
269		Vinod Viswanath, Shobha Vasudevan, Jacob A. Abraham: Dedicated Rewriting: Automatic Verification of Low Power Transformations in RTL. VLSI Design 2009: 77-82
268		Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham: On-Line Calibration and Power Optimization of RF Systems Using a Built-In Detector. VTS 2009: 285-290
267		Jaeyong Chung, Jacob A. Abraham: Recursive Path Selection for Delay Fault Testing. VTS 2009: 65-70
266		Rajeshwary Tayade, Jacob A. Abraham: Critical Path Selection for Delay Testing Considering Coupling Noise. J. Electronic Testing 25(4-5): 213-223 (2009)
265		Vinod Viswanath, Shobha Vasudevan, Jacob A. Abraham: Dedicated Rewriting: Automatic Verification of Low Power Transformations in Register Transfer Level. J. Low Power Electronics 5(3): 339-353 (2009)
	2008
264		Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Suriyaprakash Natarajan: On efficient generation of instruction sequences to test for delay defects in a processor. ACM Great Lakes Symposium on VLSI 2008: 279-284
263		Rajeshwary Tayade, Sani R. Nassif, Jacob A. Abraham: Analytical model for the impact of multiple input switching noise on timing. ASP-DAC 2008: 514-517
262		Ramtilak Vemu, Abhijit Jas, Jacob A. Abraham, Srinivas Patil, Rajesh Galivanche: A low-cost concurrent error detection technique for processor control logic. DATE 2008: 897-902
261		Jacob A. Abraham: Implications of Technology Trends on System Dependability. DATE 2008: 940
260		Rajeshwary Tayade, Jacob A. Abraham: Critical Path Selection for Delay Test Considering Coupling Noise. European Test Symposium 2008: 119-124
259		Qingqi Dou, Jacob A. Abraham: Jitter Decomposition in High-Speed Communication Systems. European Test Symposium 2008: 157-162
258		Baker Mohammad, Stephen Bijansky, Adnan Aziz, Jacob A. Abraham: Adaptive SRAM memory for low power and high yield. ICCD 2008: 176-181
257		Ramtilak Vemu, Jacob A. Abraham: Budget-Dependent Control-Flow Error Detection. IOLTS 2008: 73-78
256		Baker Mohammad, Martin Saint-Laurent, Paul Bassett, Jacob A. Abraham: Cache Design for Low Power and High Yield. ISQED 2008: 103-107
255		Savithri Sundareswaran, Jacob A. Abraham, Alexandre Ardelea, Rajendran Panda: Characterization of Standard Cells for Intra-Cell Mismatch Variations. ISQED 2008: 213-219
254		Rajeshwary Tayade, Jacob A. Abraham: On-chip Programmable Capture for Accurate Path Delay Test and Characterization. ITC 2008: 1-10
253		Savithri Sundareswaran, Lucie Nechanicka, Rajendran Panda, Sergey Gavrilov, Roman Solovyev, Jacob A. Abraham: A timing methodology considering within-die clock skew variations. SoCC 2008: 351-356
252		Sriram Sambamurthy, Jacob A. Abraham, Raghuram S. Tupuri: A Robust Top-Down Dynamic Power Estimation Methodology for Delay Constrained Register Transfer Level Sequential Circuits. VLSI Design 2008: 521-526
251		Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham: Low Cost RF Receiver Parameter Measurement with On-Chip Amplitude Detectors. VTS 2008: 203-208
250		Byoungho Kim, Nash Khouzam, Jacob A. Abraham: Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. VTS 2008: 293-298
249		Qingqi Dou, Jacob A. Abraham: Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems. VTS 2008: 3-8
248		Joonsung Park, Hongjoong Shin, Jacob A. Abraham: Parallel Loopback Test of Mixed-Signal Circuits. VTS 2008: 309-316
247		Shobha Vasudevan, Vinod Viswanath, Jacob A. Abraham, Jiajin Tu: Sequential equivalence checking between system level and RTL descriptions. Design Autom. for Emb. Sys. 12(4): 377-396 (2008)
246		Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka: Performance-Optimized Design for Parametric Reliability. J. Electronic Testing 24(1-3): 129-141 (2008)
245		Ramyanshu Datta, Ravi Gupta, Antony Sebastine, Jacob A. Abraham, Manuel A. d'Abreu: Controllability of Static CMOS Circuits for Timing Characterization. J. Electronic Testing 24(5): 481-496 (2008)
244		Rajeshwary Tayade, Jacob A. Abraham: Small-delay defect detection in the presence of process variations. Microelectronics Journal 39(8): 1093-1100 (2008)
	2007
243		Jen-Chieh Ou, Daniel G. Saab, Qiang Qiang, Jacob A. Abraham: Reducing verification overhead with RTL slicing. ACM Great Lakes Symposium on VLSI 2007: 399-404
242		Rajeshwary Tayade, Vijay Kiran Kalyanam, Sani R. Nassif, Michael Orshansky, Jacob A. Abraham: Estimating path delay distribution considering coupling noise. ACM Great Lakes Symposium on VLSI 2007: 61-66
241		Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab: Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. European Test Symposium 2007: 173-178
240		Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham: Built-In Test of RF Mixers Using RF Amplitude Detectors. ISQED 2007: 404-409
239		Joonsung Park, Hongjoong Shin, Jacob A. Abraham: Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. ISQED 2007: 495-500
238		Rajeshwary Tayade, Savithri Sundareswaran, Jacob A. Abraham: Small-Delay Defect Detection in the Presence of Process Variations. ISQED 2007: 711-716
237		Ramtilak Vemu, Sankar Gurumurthy, Jacob A. Abraham: ACCE: Automatic correction of control-flow errors. ITC 2007: 1-10
236		Shobha Vasudevan, Vinod Viswanath, Jacob A. Abraham: Efficient Microprocessor Verification using Antecedent Conditioned Slicing. VLSI Design 2007: 43-49
235		Jacob A. Abraham, Daniel G. Saab: Tutorial T4A: Formal Verification Techniques and Tools for Complex Designs. VLSI Design 2007: 6
234		Byoungho Kim, Zhenhai Fu, Jacob A. Abraham: Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. VTS 2007: 291-296
233		Shobha Vasudevan, Vinod Viswanath, Robert W. Sumners, Jacob A. Abraham: Automatic Verification of Arithmetic Circuits in RTL Using Stepwise Refinement of Term Rewriting Systems. IEEE Trans. Computers 56(10): 1401-1414 (2007)
232		Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham: Predicting mixed-signal dynamic performance using optimised signature-based alternate test. IET Computers & Digital Techniques 1(3): 159-169 (2007)
231		Shobha Vasudevan, E. Allen Emerson, Jacob A. Abraham: Improved verification of hardware designs through antecedent conditioned slicing. STTT 9(1): 89-101 (2007)
	2006
230		Qingqi Dou, Jacob A. Abraham: Jitter decomposition in ring oscillators. ASP-DAC 2006: 285-290
229		Vinod Viswanath, Jacob A. Abraham, Warren A. Hunt Jr.: Automatic insertion of low power annotations in RTL for pipelined microprocessors. DATE 2006: 496-501
228		Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka: Adaptive Design for Performance-Optimized Robustness. DFT 2006: 3-11
227		Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham: Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. European Test Symposium 2006: 199-204
226		Ramtilak Vemu, Jacob A. Abraham: CEDA: Control-flow Error Detection through Assertions. IOLTS 2006: 151-158
225		Qingqi Dou, Jacob A. Abraham: Jitter Decomposition by Time Lag Correlation. ISQED 2006: 525-530
224		Hongjoong Shin, Joonsung Park, Jacob A. Abraham: Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. ITC 2006: 1-10
223		Jen-Chieh Ou, Daniel G. Saab, Jacob A. Abraham: HDL Program Slicing to Reduce Bounded Model Checking Search Overhead. ITC 2006: 1-7
222		Sankar Gurumurthy, Shobha Vasudevan, Jacob A. Abraham: Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor. ITC 2006: 1-9
221		Shobha Vasudevan, Jacob A. Abraham, Vinod Viswanath, Jiajin Tu: Automatic decomposition for sequential equivalence checking of system level and RTL descriptions. MEMOCODE 2006: 71-80
220		Sriram Sambamurthy, Jacob A. Abraham, Raghuram S. Tupuri: Delay Constrained Register Transfer Level Dynamic Power Estimation. PATMOS 2006: 36-46
219		Qiang Qiang, Daniel G. Saab, Jacob A. Abraham: Checking Nested Properties Using Bounded Model Checking and Sequential ATPG. VLSI Design 2006: 225-230
218		Ramyanshu Datta, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham: A Scheme for On-Chip Timing Characterization. VTS 2006: 24-29
217		Hongjoong Shin, Byoungho Kim, Jacob A. Abraham: Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. VTS 2006: 412-419
	2005
216		Qiang Qiang, Daniel G. Saab, Jacob A. Abraham: An Emulation Model for Sequential ATPG-Based Bounded Model Checking. FPL 2005: 469-474
215		Qiang Qiang, Chia-Lun Chang, Daniel G. Saab, Jacob A. Abraham: Case Study of ATPG-based Bounded Model Checking: Verifying USB2.0 IP Core. ICCD 2005: 461-463
214		S. Guramurthy, Shobha Vasudevan, Jacob A. Abraham: Automated mapping of pre-computed module-level test sequences to processor instructions. ITC 2005: 10
213		Ramyanshu Datta, Sani R. Nassif, Robert K. Montoye, Jacob A. Abraham: Testing and debugging delay faults in dynamic circuits. ITC 2005: 10
212		Shobha Vasudevan, E. Allen Emerson, Jacob A. Abraham: Efficient Model Checking of Hardware Using Conditioned Slicing. Electr. Notes Theor. Comput. Sci. 128(6): 279-294 (2005)
211		Jayanta Bhadra, Andrew K. Martin, Jacob A. Abraham: A Formal Framework for Verification of Embedded Custom Memories of the Motorola MPC7450 Microprocessor. Formal Methods in System Design 27(1-2): 67-112 (2005)
	2004
210		Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Jacob A. Abraham: On-chip delay measurement for silicon debug. ACM Great Lakes Symposium on VLSI 2004: 145-148
209		Hongjoong Shin, Hak-soo Yu, Jacob A. Abraham: LFSR-based BIST for analog circuits using slope detection. ACM Great Lakes Symposium on VLSI 2004: 316-321
208		Ji Hwan (Paul) Chun, Hak-soo Yu, Jacob A. Abraham: An efficient linearity test for on-chip high speed ADC and DAC using loop-back. ACM Great Lakes Symposium on VLSI 2004: 328-331
207		Jianhua Gan, Shouli Yan, Jacob A. Abraham: Effects of noise and nonlinearity on the calibration of a non-binary capacitor array in a successive approximation analog-to-digital converter. ASP-DAC 2004: 292-297
206		Shobha Vasudevan, Jacob A. Abraham: Static program transformations for efficient software model checking. IFIP Congress Topical Sessions 2004: 257-282
205		Ramyanshu Datta, Jacob A. Abraham, Robert K. Montoye, Wendy Belluomini, Hung C. Ngo, Chandler McDowell, Jente B. Kuang, Kevin J. Nowka: A low latency and low power dynamic Carry Save Adder. ISCAS (2) 2004: 477-480
204		Ramyanshu Datta, Ravi Gupta, Antony Sebastine, Jacob A. Abraham, Manuel A. d'Abreu: Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing. ITC 2004: 1118-1127
203		Hak-soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham: Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. ITC 2004: 1389-1397
202		Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee: Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. ITC 2004: 252-261
201		Jing Zeng, Magdy S. Abadir, A. Kolhatkar, G. Vandling, Li-C. Wang, Jacob A. Abraham: On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. ITC 2004: 31-37
200		Alper Sen, Vijay K. Garg, Jacob A. Abraham, Jayanta Bhadra: Formal Verification of a System-on-Chip Using Computation Slicing. ITC 2004: 810-819
199		Jing Zeng, Magdy S. Abadir, G. Vandling, Li-C. Wang, S. Karako, Jacob A. Abraham: On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. MTV 2004: 103-109
198		Narayanan Krishnamurthy, Jayanta Bhadra, Magdy S. Abadir, Jacob A. Abraham: Towards The Complete Elimination of Gate/Switch Level Simulations. VLSI Design 2004: 115-
197		Vivekananda M. Vedula, Whitney J. Townsend, Jacob A. Abraham: Program Slicing for ATPG-Based Property Checking. VLSI Design 2004: 591-596
196		Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee: Prediction of Analog Performance Parameters Using Oscillation Based Test. VTS 2004: 377-382
195		Jeongjin Roh, Jacob A. Abraham: Subband filtering for time and frequency analysis of mixed-signal circuit testing. IEEE T. Instrumentation and Measurement 53(2): 602-611 (2004)
	2003
194		Jianhua Gan, Shouli Yan, Jacob A. Abraham: Design and modeling of a 16-bit 1.5MSPS successive approximation ADC with non-binary capacitor array. ACM Great Lakes Symposium on VLSI 2003: 161-164
193		Whitney J. Townsend, Jacob A. Abraham, Earl E. Swartzlander Jr.: Quadruple Time Redundancy Adders. DFT 2003: 250-256
192		Whitney J. Townsend, Jacob A. Abraham, Parag K. Lala: On-Line Error Detecting Constant Delay Adder. IOLTS 2003: 17-
191		Arun Krishnamachary, Jacob A. Abraham: Effects of Multi-cycle Sensitization on Delay Tests. VLSI Design 2003: 137-142
190		Daniel G. Saab, Jacob A. Abraham, Vivekananda M. Vedula: Formal Verification Using Bounded Model Checking: SAT versus Sequential ATPG Engines. VLSI Design 2003: 243-248
189		Hak-soo Yu, Sungbae Hwang, Jacob A. Abraham: DSP-Based Statistical Self Test of On-Chip Converters. VTS 2003: 83-88
188		Kyoil Kim, Jacob A. Abraham, Jayanta Bhadra: Model Checking of Security Protocols with Pre-configuration. WISA 2003: 1-15
187		Sungbae Hwang, Jacob A. Abraham: Test data compression and test time reduction using an embedded microprocessor. IEEE Trans. VLSI Syst. 11(5): 853-862 (2003)
186		Jeongjin Roh, Jacob A. Abraham: A comprehensive signature analysis scheme for oscillation-test. IEEE Trans. on CAD of Integrated Circuits and Systems 22(10): 1409-1423 (2003)
185		Vivekananda M. Vedula, Jacob A. Abraham, Jayanta Bhadra, Raghuram S. Tupuri: A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages. J. Electronic Testing 19(2): 149-160 (2003)
	2002
184		Sungbae Hwang, Jacob A. Abraham: Selective-run built-in self-test using an embedded processor. ACM Great Lakes Symposium on VLSI 2002: 124-129
183		Arun Krishnamachary, Jacob A. Abraham: Test generation for resistive opens in CMOS. ACM Great Lakes Symposium on VLSI 2002: 65-70
182		Jason Baumgartner, Andreas Kuehlmann, Jacob A. Abraham: Property Checking via Structural Analysis. CAV 2002: 151-165
181		Jing Zeng, Magdy S. Abadir, Jacob A. Abraham: False timing path identification using ATPG techniques and delay-based information. DAC 2002: 562-565
180		Vivekananda M. Vedula, Jacob A. Abraham: FACTOR: A Hierarchical Methodology for Functional Test Generation and Testability Analysis. DATE 2002: 730-734
179		Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri: A Comprehensive Fault Model for Deep Submicron Digital Circuits. DELTA 2002: 360-364
178		Daniel G. Saab, Fatih Kocan, Jacob A. Abraham: Massively Parallel/Reconfigurable Emulation Model for the D-algorithm. FPL 2002: 1172-1176
177		Kamalnayan Jayaraman, Vivekananda M. Vedula, Jacob A. Abraham: Native Mode Functional Self-Test Generation for Systems-on-Chip. ISQED 2002: 280-285
176		Jacob A. Abraham, Vivekananda M. Vedula, Daniel G. Saab: Verifying Properties Using Sequential ATPG. ITC 2002: 194-202
175		Sungbae Hwang, Jacob A. Abraham: Optimal BIST Using an Embedded Microprocessor. ITC 2002: 736-745
174		Hak-soo Yu, Jacob A. Abraham: An Efficient 3-Bit -Scan Multiplier without Overlapping Bits, and Its 64x64 Bit Implementation. VLSI Design 2002: 441-446
173		Vivekananda M. Vedula, Jacob A. Abraham, Jayanta Bhadra: Program Slicing for Hierarchical Test Generation. VTS 2002: 237-246
172		Narayanan Krishnamurthy, Jayanta Bhadra, Magdy S. Abadir, Jacob A. Abraham: Is State Mapping Essential for Equivalence Checking Custom Memories in Scan-Based Designs? VTS 2002: 275-280
171		Rajarshi Mukherjee, Jawahar Jain, Koichiro Takayama, Jacob A. Abraham, Donald S. Fussell, Masahiro Fujita: Efficient Combinational Verification Using Overlapping Local BDDs and a Hash Table. Formal Methods in System Design 21(1): 95-101 (2002)
	2001
170		Jayanta Bhadra, Andrew K. Martin, Jacob A. Abraham, Magdy S. Abadir: Using Abstract Specifications to Verify PowerPCTM Custom Memories by Symbolic Trajectory Evaluation. CHARME 2001: 386-402
169		Jing Zeng, Magdy S. Abadir, Jayanta Bhadra, Jacob A. Abraham: Full chip false timing path identification: applications to the PowerPCTM microprocessors. DATE 2001: 514-519
168		Arun Krishnamachary, Jacob A. Abraham, Raghuram S. Tupuri: Timing Verification and Delay Test Generation for Hierarchical Designs. VLSI Design 2001: 157-162
167		Henry Chang, Steve Dollens, Gordon Roberts, Charles E. Stroud, Mani Soma, Jacob A. Abraham: Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them? VTS 2001: 415-416
166		Narayanan Krishnamurthy, Magdy S. Abadir, Andrew K. Martin, Jacob A. Abraham: Design and Development Paradigm for Industrial Formal Verification CAD Tools. IEEE Design & Test of Computers 18(4): 26-35 (2001)
165		Suresh Seshadri, Jacob A. Abraham: Frequency Response Verification of Analog Circuits Using Global Optimization Techniques. J. Electronic Testing 17(5): 395-408 (2001)
	2000
164		Nina Saxena, Jacob A. Abraham, Avijit Saha: Causality based generation of directed test cases. ASP-DAC 2000: 503-508
163		Jeongjin Roh, Suresh Seshadri, Jacob A. Abraham: Verification of Delta-Sigma Converters Using Adaptive Regression Modeling. ICCAD 2000: 182-187
162		Hak-soo Yu, Songjun Lee, Jacob A. Abraham: An Adder Using Charge Sharing and its Application in DRAMs. ICCD 2000: 311-317
161		Raghuram S. Tupuri, Jacob A. Abraham, Daniel G. Saab: Hierarchical Test Generation for Systems On a Chip. VLSI Design 2000: 198-
160		Robert W. Sumners, Jayanta Bhadra, Jacob A. Abraham: Automatic Validation Test Generation Using Extracted Control Models. VLSI Design 2000: 312-
159		Jeongjin Roh, Jacob A. Abraham: A Mixed-Signal BIST Scheme with Time-Division Multiplexing (TDM) Comparator and Counters. VLSI Design 2000: 572-
158		Pradip Bose, Jacob A. Abraham: Performance and Functional Verification of Microprocessors. VLSI Design 2000: 58-63
157		Jeongjin Roh, Jacob A. Abraham: A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test. VTS 2000: 143-148
156		Narayanan Krishnamurthy, Andrew K. Martin, Magdy S. Abadir, Jacob A. Abraham: Validation of PowerPC(tm) Custom Memories using Symbolic Simulation. VTS 2000: 9-14
155		Narayanan Krishnamurthy, Andrew K. Martin, Magdy S. Abadir, Jacob A. Abraham: Validating PowerPC Microprocessor Custom Memories. IEEE Design & Test of Computers 17(4): 61-76 (2000)
154		Jian Shen, Jacob A. Abraham: An RTL Abstraction Technique for Processor Microarchitecture Validation and Test Generation. J. Electronic Testing 16(1-2): 67-81 (2000)
	1999
153		Jian Shen, Jacob A. Abraham, Dave Baker, Tony Hurson, Martin Kinkade, Gregorio Gervasio, Chen-chau Chu, Guanghui Hu: Functional Verification of the Equator MAP1000 Microprocessor. DAC 1999: 169-174
152		Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. Abraham: Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor. DAC 1999: 647-652
151		Richard Raimi, Jacob A. Abraham: Detecting False Timing Paths: Experiments on PowerPC Microprocessors. DAC 1999: 737-741
150		Rajarshi Mukherjee, Jawahar Jain, Koichiro Takayama, Masahiro Fujita, Jacob A. Abraham, Donald S. Fussell: An Efficient Filter-Based Approach for Combinational Verification. DATE 1999: 132-137
149		Chia-Pin R. Liu, Jacob A. Abraham: Transistor Level Synthesis for Static CMOS Combinational Circuits. Great Lakes Symposium on VLSI 1999: 172-175
148		Dinos Moundanos, Jacob A. Abraham: Formal Checking of Properties in Complex Systems Using Abstractions. Great Lakes Symposium on VLSI 1999: 280-283
147		Robert W. Sumners, Jayanta Bhadra, Jacob A. Abraham: Improving Witness Search Using Orders on States. ICCD 1999: 452-457
146		Jacob A. Abraham: Position Statement: Increasing Test Coverage in a VLSI Design Course. ITC 1999: 1132
145		Jeongjin Roh, Jacob A. Abraham: Subband filtering scheme for analog and mixed-signal circuit testing. ITC 1999: 221-229
144		Kyung Tek Lee, Jacob A. Abraham: Critical path identification and delay tests of dynamic circuits. ITC 1999: 421-430
143		Rathish Jayabharathi, Manuel A. d'Abreu, Jacob A. Abraham: FzCRITIC - A Functional Timing Verifier Using a Novel Fuzzy Delay Model. VLSI Design 1999: 232-235
142		Jian Shen, Jacob A. Abraham: Verification of Processor Microarchitectures. VTS 1999: 189-194
141		Zeyad Alkhalifa, V. S. S. Nair, Narayanan Krishnamurthy, Jacob A. Abraham: Design and Evaluation of System-Level Checks for On-Line Control Flow Error Detection. IEEE Trans. Parallel Distrib. Syst. 10(6): 627-641 (1999)
140		Rajarshi Mukherjee, Jawahar Jain, Koichiro Takayama, Masahiro Fujita, Jacob A. Abraham, Donald S. Fussell: An efficient filter-based approach for combinational verification. IEEE Trans. on CAD of Integrated Circuits and Systems 18(11): 1542-1557 (1999)
139		Dinos Moundanos, Jacob A. Abraham: On Design Validation Using Verification Technology. J. Electronic Testing 15(1-2): 173-189 (1999)
	1998
138		Karl-Erwin Großpietsch, Jacob A. Abraham, Johannes Maier, Hans-Dieter Kochs, Michel Renovell: From Dependable Computing Systems to Computing for Integrated Dependable Systems? (Panel). FTCS 1998: 296-301
137		Sujit Dey, Jacob A. Abraham, Yervant Zorian: High-level design validation and test. ICCAD 1998: 3
136		Jian Shen, Jacob A. Abraham: Native mode functional test generation for processors with applications to self test and design validation. ITC 1998: 990-999
135		Dinos Moundanos, Jacob A. Abraham: Using Verification Technology for Validation Coverage Analysis and Test Generation. VTS 1998: 254-259
134		Kyung Tek Lee, Clay Nordquist, Jacob A. Abraham: Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits. VTS 1998: 34-41
133		Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Hoskote: Abstraction Techniques for Validation Coverage Analysis and Test Generation. IEEE Trans. Computers 47(1): 2-14 (1998)
132		Naveena Nagi, Abhijit Chatterjee, Heebyung Yoon, Jacob A. Abraham: Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Trans. on CAD of Integrated Circuits and Systems 17(6): 540-546 (1998)
131		Jian Shen, Jacob A. Abraham: Synthesis of Native Mode Self-Test Programs. J. Electronic Testing 13(2): 137-148 (1998)
130		Craig M. Chase, Prakash Arunachalam, Jacob A. Abraham: Memory Distribution: Techniques and Practice for CAD Applications. Parallel Computing 24(11): 1597-1615 (1998)
	1997
129		Jun Yuan, Jian Shen, Jacob A. Abraham, Adnan Aziz: On Combining Formal and Informal Verification. CAV 1997: 376-387
128		Robert W. Sumners, Jacob A. Abraham: Hierarchical Specification of System Behavior. HASE 1997: 134-140
127		Raghuram S. Tupuri, Jacob A. Abraham: A Novel Functional Test Generation Method for Processors Using Commercial ATPG. ITC 1997: 743-752
126		Raghuram S. Tupuri, Jacob A. Abraham: A Novel Hierarchical Test Generation Method for Processors. VLSI Design 1997: 540-541
125		Rathish Jayabharathi, Kyung Tek Lee, Jacob A. Abraham: A Novel Solution for Chip-Level Functional Timing Verification. VTS 1997: 137-142
124		Magdy S. Abadir, Jacob A. Abraham, H. Hao, C. Hunter, Wayne M. Needham, Ron G. Walther: Microprocessor Test and Validation: Any New Avenues? VTS 1997: 458-464
123		Jawahar Jain, James R. Bitner, Magdy S. Abadir, Jacob A. Abraham, Donald S. Fussell: Indexed BDDs: Algorithmic Advances in Techniques to Represent and Verify Boolean Functions. IEEE Trans. Computers 46(11): 1230-1245 (1997)
122		Yatin Vasant Hoskote, Jacob A. Abraham, Donald S. Fussell, John Moondanos: Automatic verification of implementations of large circuits against HDL specifications. IEEE Trans. on CAD of Integrated Circuits and Systems 16(3): 217-228 (1997)
121		Hoon Chang, Jacob A. Abraham: An Efficient Critical Path Tracing Algorithm for Designing High Performance Vlsi Systems. J. Electronic Testing 11(2): 119-129 (1997)
	1996
120		Prakash Arunachalam, Jacob A. Abraham, Manuel A. d'Abreu: A Hierarchal Approach for Power Reduction in VLSI Chips. Great Lakes Symposium on VLSI 1996: 182-
119		Sankaran Karthik, Mark Aitken, Glidden Martin, Srinivasu Pappula, Bob Stettler, Praveen Vishakantaiah, Manuel A. d'Abreu, Jacob A. Abraham: Distributed Mixed Level Logic and Fault Simulation on the Pentium® Pro Microprocessor. ITC 1996: 160-166
118		Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Hoskote: A Unified Framework for Design Validation and Manufacturing Test. ITC 1996: 875-884
117		Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita, Jacob A. Abraham, Donald S. Fussell: On More Efficient Combinational ATPG Using Functional Learning. VLSI Design 1996: 107-110
116		Jacob A. Abraham, Gopi Ganapathy: Practical Test and DFT for Next Generation VLSI. VLSI Design 1996: 3
115		Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham: Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. VTS 1996: 354-361
114		Hong Helena Zheng, Ashok Balivada, Jacob A. Abraham: A novel test generation approach for parametric faults in linear analog circuits . VTS 1996: 470-475
113		Ashok Balivada, Jin Chen, Jacob A. Abraham: Analog Testing with Time Response Parameters. IEEE Design & Test of Computers 13(2): 18-25 (1996)
112		V. S. S. Nair, Jacob A. Abraham, Prithviraj Banerjee: Efficient Techniques for the Analysis of Algorithm-Based Fault Tolerance (ABFT) Schemes. IEEE Trans. Computers 45(4): 499-503 (1996)
111		Daniel G. Saab, Youssef Saab, Jacob A. Abraham: Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 15(10): 1278-1285 (1996)
110		Ashok Balivada, Hong Zheng, Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: A unified approach for fault simulation of linear mixed-signal circuits. J. Electronic Testing 9(1-2): 29-41 (1996)
	1995
109		Yatin Vasant Hoskote, Jacob A. Abraham, Donald S. Fussell: Automated verification of temporal properties specified as state machines in VHDL. Great Lakes Symposium on VLSI 1995: 100-105
108		Yatin Vasant Hoskote, Dinos Moundanos, Jacob A. Abraham: Automatic extraction of the control flow machine and application to evaluating coverage of verification vectors. ICCD 1995: 532-537
107		Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham: Efficient multisine testing of analog circuits. VLSI Design 1995: 234-238
106		Jawahar Jain, Dinos Moundanos, James R. Bitner, Jacob A. Abraham, Donald S. Fussell, Don E. Ross: Efficient variable ordering and partial representation algorithm. VLSI Design 1995: 81-86
105		Ashok Balivada, Yatin Vasant Hoskote, Jacob A. Abraham: Verification of transient response of linear analog circuits. VTS 1995: 42-47
104		Ghani A. Kanawati, Nasser A. Kanawati, Jacob A. Abraham: FERRARI: A Flexible Software-Based Fault and Error Injection System. IEEE Trans. Computers 44(2): 248-260 (1995)
	1994
103		Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther: Microprocessor Testing: Which Technique is Best? (Panel). DAC 1994: 294
102		James R. Bitner, Jawahar Jain, Magdy S. Abadir, Jacob A. Abraham, Donald S. Fussell: Efficient Algorithmic Circuit Verification Using Indexed BDDs. FTCS 1994: 266-275
101		Abhijit Chatterjee, Jacob A. Abraham: RAFT191486: a novel program for rapid-fire test and diagnosis of digital logic for marginal delays and delay faults. ICCAD 1994: 340-343
100		Daniel G. Saab, Youssef Saab, Jacob A. Abraham: Iterative [simulation-based genetics + deterministic techniques]= complete ATPG0. ICCAD 1994: 40-43
99		Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: A Signature Analyzer for Analog and Mixed-signal Circuits. ICCD 1994: 284-287
98		Edwin de Angel, Earl E. Swartzlander Jr., Jacob A. Abraham: A New Asynchronous Multiplier Using Enable/Disable CMOS Differential Logic. ICCD 1994: 302-305
97		S. Surya, Pradip Bose, Jacob A. Abraham: Architectural Performance Verification: PowerPCTM Processors. ICCD 1994: 344-347
96		Yatin Vasant Hoskote, John Moondanos, Jacob A. Abraham, Donald S. Fussell: Verification of Circuits Described in VHDL through Extraction of Design Intent. VLSI Design 1994: 417-420
95		Marc E. Levitt, Kaushik Roy, Jacob A. Abraham: BiCMOS logic testing. IEEE Trans. VLSI Syst. 2(2): 241-248 (1994)
94		Hoon Chang, Jacob A. Abraham: An efficient critical path tracing algorithm for sequential circuits. Microprocessing and Microprogramming 40(10-12): 913-916 (1994)
	1993
93		Hoon Chang, Jacob A. Abraham: VIPER: An Efficient Vigorously Sensitizable Path Extractor. DAC 1993: 112-117
92		Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: DRAFTS: Discretized Analog Circuit Fault Simulator. DAC 1993: 509-514
91		Gopi Ganapathy, Jacob A. Abraham: Selective Pseudo Scan: Combinational ATPG with Reduced Scan in a Full Custom RISC Microprocessor. DAC 1993: 550-555
90		Praveen Vishakantaiah, Jacob A. Abraham: Impact of Behavioral Learning on the Compilation of Sequential Circuit Tests. FTCS 1993: 370-379
89		Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham: Fault-based automatic test generator for linear analog circuits. ICCAD 1993: 88-91
88		Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: MIXER: Mixed-Signal Fault Simulator. ICCD 1993: 568-571
87		Praveen Vishakantaiah, Thomas Thomas, Jacob A. Abraham, Magdy S. Abadir: AMBIANT: Automatic Generation of Behavioral Modifications for Testability. ICCD 1993: 63-66
86		Praveen Vishakantaiah, Jacob A. Abraham, Daniel G. Saab: CHEETA: Composition of Hierarchical Sequential Tests Using ATKET. ITC 1993: 606-615
85		Sankaran Karthik, Jacob A. Abraham, Raymond P. Voith: Optimizations for Behavioral/RTL Simulation. VLSI Design 1993: 311-316
84		Robert B. Mueller-Thuns, Daniel G. Saab, Robert F. Damiano, Jacob A. Abraham: Benchmarking Parallel Processing Platforms: An Applications Perspective. IEEE Trans. Parallel Distrib. Syst. 4(8): 947-954 (1993)
83		Robert B. Mueller-Thuns, Daniel G. Saab, Robert F. Damiano, Jacob A. Abraham: VLSI logic and fault simulation on general-purpose parallel computers. IEEE Trans. on CAD of Integrated Circuits and Systems 12(3): 446-460 (1993)
82		Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: Fault simulation of linear analog circuits. J. Electronic Testing 4(4): 345-360 (1993)
	1992
81		Praveen Vishakantaiah, Jacob A. Abraham, Magdy S. Abadir: Automatic Test Knowledge Extraction from VHDL (ATKET). DAC 1992: 273-278
80		Ghani A. Kanawati, Nasser A. Kanawati, Jacob A. Abraham: FERRARI: A Tool for The Validation of System Dependability Properties. FTCS 1992: 336-344
79		Junsheng Long, W. Kent Fuchs, Jacob A. Abraham: Compiler-Assisted Static Checkpoint Insertion. FTCS 1992: 58-65
78		Daniel G. Saab, Youssef Saab, Jacob A. Abraham: CRIS: a test cultivation program for sequential VLSI circuits. ICCAD 1992: 216-219
77		Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu: Automatic test generation for linear digital systems with bi-level search using matrix transform methods. ICCAD 1992: 224-228
76		Sankaran Karthik, Jacob A. Abraham: Distributed VLSI Simulation on a Network of Workstations. ICCD 1992: 508-511
75		John Moondanos, Jacob A. Abraham: Sequential Redundancy Identification Using Verification Techniques. ITC 1992: 197-205
74		Jawahar Jain, Jacob A. Abraham, James R. Bitner, Donald S. Fussell: Probabilistic Verification of Boolean Functions. Formal Methods in System Design 1(1): 61-115 (1992)
73		V. S. S. Nair, Yatin Vasant Hoskote, Jacob A. Abraham: Probabilistic Evaluation of On-Line Checks in Fault-Tolerant Multiprocessor Systems. IEEE Trans. Computers 41(5): 532-541 (1992)
72		Thomas M. Niermann, Rabindra K. Roy, Janak H. Patel, Jacob A. Abraham: Test compaction for sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 11(2): 260-267 (1992)
71		Chun-Hung Chen, Jacob A. Abraham: Generation and evaluation of current and logic tests for switch-level sequential circuits. J. Electronic Testing 3(4): 359-366 (1992)
	1991
70		Jawahar Jain, Jim Bitner, Donald S. Fussell, Jacob A. Abraham: Probabilistic Design Verification. ICCAD 1991: 468-471
69		Sankaran Karthik, Indira de Souza, Joseph T. Rahmeh, Jacob A. Abraham: Interlock Schemes for Micropiplines: Application to a Self-Timed Rebound Sorter. ICCD 1991: 393-396
68		Chun-Hung Chen, Jacob A. Abraham: High Quality Tests for Switch-Level Circuits Using Current and Logic Test Generation Algorithms. ITC 1991: 615-622
67		Gopi Ganapathy, Jacob A. Abraham: Hardware Acceleration Alone Will Not Make Fault Grading ULSI a Reality. ITC 1991: 848-857
66		Abhijit Chatterjee, Jacob A. Abraham: Test Generation for Iterative Logic Arrays Based on an N-Cube of Cell States Model. IEEE Trans. Computers 40(10): 1133-1148 (1991)
65		Abhijit Chatterjee, Jacob A. Abraham: Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling. J. Electronic Testing 2(4): 351-372 (1991)
	1990
64		Ramachandra P. Kunda, Jacob A. Abraham, Bharat Deep Rathi, Prakash Narain: Speed Up of Test Generation Using High-Level Primitives. DAC 1990: 594-599
63		David T. Blaauw, Daniel G. Saab, Junsheng Long, Jacob A. Abraham: Derivation of signal flow for switch-level simulation. EURO-DAC 1990: 301-305
62		Kaushik Roy, Jacob A. Abraham: High level test generation using data flow descriptions. EURO-DAC 1990: 480-484
61		Suku Nair, Jacob A. Abraham: Hierarchical design and analysis of fault-tolerant multiprocessor systems using concurrent error detection. FTCS 1990: 130-137
60		Chun-Hung Chen, Jacob A. Abraham: Mixed-Level Sequential Test Generation Using a Nine-Valued Relaxation Algorithm. ICCAD 1990: 230-233
59		David Blaauw, Robert B. Mueller-Thuns, Daniel G. Saab, Prithviraj Banerjee, Jacob A. Abraham: SNEL: A Switch-Level Simulator Using Multiple Levels of Functional Abstraction. ICCAD 1990: 66-69
58		Junsheng Long, W. Kent Fuchs, Jacob A. Abraham: Forward Recovery Using Checkpointing in Parallel Systems. ICPP (1) 1990: 272-275
57		John C. Chan, Jacob A. Abraham: A study of faulty signatures using a matrix formulation. ITC 1990: 553-561
56		Robert B. Mueller-Thuns, Daniel G. Saab, Jacob A. Abraham: Design of a scalable parallel switch-level simulator for VLSI. SC 1990: 615-624
55		Abhijit Chatterjee, Jacob A. Abraham: The Testability of Generalized Counters Under Multiple Faulty Cells. IEEE Trans. Computers 39(11): 1378-1385 (1990)
54		V. S. S. Nair, Jacob A. Abraham: Real-Number Codes for Bault-Tolerant Matrix Operations On Processor Arrays. IEEE Trans. Computers 39(4): 426-435 (1990)
53		Prithviraj Banerjee, Joseph T. Rahmeh, Craig B. Stunkel, V. S. S. Nair, Kaushik Roy, Vijay Balasubramanian, Jacob A. Abraham: Algorithm-Based Fault Tolerance on a Hypercube Multiprocessor. IEEE Trans. Computers 39(9): 1132-1145 (1990)
52		Daniel G. Saab, Robert B. Mueller-Thuns, David Blaauw, Joseph T. Rahmeh, Jacob A. Abraham: Hierarchical multi-level fault simulation of large systems. J. Electronic Testing 1(2): 139-149 (1990)
	1989
51		David Blaauw, Daniel G. Saab, Robert B. Mueller-Thuns, Jacob A. Abraham, Joseph T. Rahmeh: Automatic Generation of Behavioral Models from Switch-Level Descriptions. DAC 1989: 179-184
50		Carol V. Gura, Jacob A. Abraham: Average Interconnection Length and Interconnection Distribution Based on Rent's Rule. DAC 1989: 574-577
49		Kaushik Roy, Jacob A. Abraham: A Novel Approach to Accurate Timing Verification Using RTL Descriptions. DAC 1989: 638-641
48		Jacob A. Abraham: Advances in VLSI-Testing. IFIP Congress 1989: 1013-1018
47		Kurt H. Thearling, Jacob A. Abraham: An Easily Computed Functional Level Testability Measure. ITC 1989: 381-390
46		Marc E. Levitt, Jacob A. Abraham: The Economics of Scan Design. ITC 1989: 869-874
	1988
45		Carol V. Gura, Jacob A. Abraham: Improved Methods of Simulating RLC Couple and Uncoupled Transmission Lines Based on the Method of Characteristics. DAC 1988: 300-305
44		Patrick A. Duba, Rabindra K. Roy, Jacob A. Abraham, William A. Rogers: Fault Simulation in a Distributed Environment. DAC 1988: 686-691
43		Suku Nair, Jacob A. Abraham: General linear codes for fault-tolerant matrix operations on processor arrays. FTCS 1988: 180-185
42		Prithviraj Banerjee, Joseph T. Rahmeh, Craig B. Stunkel, V. S. S. Nair, Kaushik Roy, Jacob A. Abraham: An evaluation of system-level fault tolerance on the Intel hypercube multiprocessor. FTCS 1988: 362-367
41		Jing-Yang Jou, Jacob A. Abraham: Fault-Tolerant Algorithms and Architectures for Real Time Signal Processing. ICPP (1) 1988: 359-362
40		M. J. Marlett, Jacob A. Abraham: DC_IATP : An Iterative Analog Circuit Test Generation Program for Generating DC Single Pattern Tests. ITC 1988: 839-844
39		Jing-Yang Jou, Jacob A. Abraham: Fault-Tolerant FFT Networks. IEEE Trans. Computers 37(5): 548-561 (1988)
	1987
38		W. Kent Fuchs, Kun-Lung Wu, Jacob A. Abraham: Comparison and Diagnosis of Large Replicated Files. IEEE Trans. Software Eng. 13(1): 15-22 (1987)
37		Abhijit Chatterjee, Jacob A. Abraham: On the C-Testability of Generalized Counters. IEEE Trans. on CAD of Integrated Circuits and Systems 6(5): 713-726 (1987)
36		William A. Rogers, John F. Guzolek, Jacob A. Abraham: Concurrent Hierarchical Fault Simulation: A Performance Model and Two Optimizations. IEEE Trans. on CAD of Integrated Circuits and Systems 6(5): 848-862 (1987)
	1986
35		Hsi-Ching Shih, Jacob A. Abraham: Transistor-level test generation for physical failures in CMOS circuits. DAC 1986: 243-249
34		Chien-Yi Chen, Jacob A. Abraham: On the Design of Fault-Tolerant Systolic Arrays with Linear Cells. FJCC 1986: 400-409
33		Kien A. Hua, Jacob A. Abraham: Design of Systems with Concurrent Error Detection Using Software Redundancy. FJCC 1986: 826-835
32		Jacob A. Abraham: Research in Reliable VLSI Architectures at the University of Illinois. FJCC 1986: 890-893
31		Prithviraj Banerjee, Jacob A. Abraham: A Probabilistic Model of Algorithm-Based Fault Tolerance in Array Processors for Real-Time Systems. IEEE Real-Time Systems Symposium 1986: 72-78
30		Robert H. Fujii, Jacob A. Abraham: Approaches to Circuit Level Design for Testability. ITC 1986: 480-483
29		Hongtao P. Chang, William A. Rogers, Jacob A. Abraham: Structured Functional Level Test Generation Using Binary Decision Diagrams. ITC 1986: 97-104
28		W. Kent Fuchs, Kun-Lung Wu, Jacob A. Abraham: Low-Cost Comparison and Diagnosis of Large Remotely Located Files. Symposium on Reliability in Distributed Software and Database Systems 1986: 67-73
27		Prithviraj Banerjee, Jacob A. Abraham: Bounds on Algorithm-Based Fault Tolerance in Multiple Processor Systems. IEEE Trans. Computers 35(4): 296-306 (1986)
26		Timothy C. K. Chou, Jacob A. Abraham: Distributed Control of Computer Systems. IEEE Trans. Computers 35(6): 564-567 (1986)
25		Hsi-Ching Shih, Joseph T. Rahmeh, Jacob A. Abraham: FAUST: An MOS Fault Simulator with Timing Information. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 557-563 (1986)
	1985
24		William A. Rogers, Jacob A. Abraham: High level hierarchical fault simulation techniques. ACM Conference on Computer Science 1985: 89-97
23		Peter Y.-T. Hsu, Joseph T. Rahmeh, Edward S. Davidson, Jacob A. Abraham: TIDBITS: Speedup Via Time-Delay Bit-Slicing in ALU Design for VLSI Technology. ISCA 1985: 28-35
22		Robert H. Fujii, Jacob A. Abraham: Self-Test for Microprocessors. ITC 1985: 356-361
21		William A. Rogers, Jacob A. Abraham: CHIEFS : A Concurrent, Hierarchical and Extensible Fault Simulator. ITC 1985: 710-716
20		Niraj K. Jha, Jacob A. Abraham: Design of Testable CMOS Logic Circuits Under Arbitrary Delays. IEEE Trans. on CAD of Integrated Circuits and Systems 4(3): 264-269 (1985)
19		Prithviraj Banerjee, Jacob A. Abraham: A Multivalued Algebra For Modeling Physical Failures in MOS VLSI Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 4(3): 312-321 (1985)
	1984
18		Prithviraj Banerjee, Jacob A. Abraham: Fault-Secure Algorithms for Multiple-Processor Systems. ISCA 1984: 279-287
17		Ramaswami Dandapani, Janak H. Patel, Jacob A. Abraham: Design of Test Pattern Generators for Built-In Test. ITC 1984: 315-319
16		Dhananjay Brahme, Jacob A. Abraham: Functional Testing of Microprocessors. IEEE Trans. Computers 33(6): 475-485 (1984)
15		Kuang-Hua Huang, Jacob A. Abraham: Algorithm-Based Fault Tolerance for Matrix Operations. IEEE Trans. Computers 33(6): 518-528 (1984)
	1983
14		Richard L. Norton, Jacob A. Abraham: Adaptive Interpretation as a Means of Exploiting Complex Instruction Sets ISCA 1983: 277-282
13		W. Kent Fuchs, Jacob A. Abraham, Kuang-Hua Huang: Concurrent Error Detection in VLSI Interconnection Networks ISCA 1983: 309-315
12		Jacob A. Abraham: Incorporating Test Technology into an Undergraduate Curriculum. ITC 1983: 162
11		Prithviraj Banerjee, Jacob A. Abraham: Generating Tests for Physical Failures in MOS Logic Circuits. ITC 1983: 554-559
10		Timothy C. K. Chou, Jacob A. Abraham: Load Redistribution Under Failure in Distributed Systems. IEEE Trans. Computers 32(9): 799-808 (1983)
	1982
9		Pradip Bose, Jacob A. Abraham: Test generation for programmable logic arrays. DAC 1982: 574-580
8		Kuang-Hua Huang, Jacob A. Abraham: Efficient parallel algorithms for processor arrays. ICPP 1982: 268-279
7		Richard L. Norton, Jacob A. Abraham: Using write back cache to improve performance of multi-user multiprocessors. ICPP 1982: 326-331
6		Timothy C. K. Chou, Jacob A. Abraham: Load Balancing in Distributed Systems. IEEE Trans. Software Eng. 8(4): 401-412 (1982)
	1981
5		Jacob A. Abraham: Functional Level Test Generation for Complex Digital Systems. ITC 1981: 461-462
4		Jacob A. Abraham, Daniel Gajski: Design of Testable Structures Defined by Simple Loops. IEEE Trans. Computers 30(11): 875-884 (1981)
	1980
3		Satish M. Thatte, Jacob A. Abraham: Test Generation for Microprocessors. IEEE Trans. Computers 29(6): 429-441 (1980)
	1978
2		Ravindra Nair, Satish M. Thatte, Jacob A. Abraham: Efficient Algorithms for Testing Semiconductor Random-Access Memories. IEEE Trans. Computers 27(6): 572-576 (1978)
	1975
1		Jacob A. Abraham: A Combinatorial Solution to the Reliability of Interwoven Redundant Logic Networks. IEEE Trans. Computers 24(5): 578-584 (1975)

Coauthor Index

1	Magdy S. Abadir	[81] [87] [102] [123] [124] [155] [156] [166] [169] [170] [172] [181] [198] [199] [201]
2	Shakeel S. Abdulla	[276] [287]
3	Mark Aitken	[119]
4	Zeyad Alkhalifa	[141]
5	Edwin de Angel	[98]
6	Alexandre Ardelea	[255]
7	Prakash Arunachalam	[120] [130]
8	Adnan Aziz	[129] [258]
9	Dave Baker	[153]
10	Vijay Balasubramanian	[53]
11	Ashok Balivada	[89] [105] [107] [110] [113] [114]
12	Aritra Banerjee	[285]
13	Prithviraj Banerjee (Prith Banerjee)	[11] [18] [19] [27] [31] [42] [53] [59] [112]
14	Paul Bassett	[256]
15	Jason Baumgartner	[182]
16	Wendy Belluomini	[205]
17	Jayanta Bhadra (Jay Bhadra)	[147] [160] [169] [170] [172] [173] [185] [188] [198] [200] [211]
18	Stephen Bijansky	[258]
19	James R. Bitner	[74] [102] [106] [123]
20	Jim Bitner	[70]
21	David Blaauw (David T. Blaauw)	[51] [52] [59] [63]
22	Pradip Bose	[9] [97] [158]
23	Dhananjay Brahme	[16]
24	Eonjo Byun	[279] [286] [291] [293] [297]
25	Gary D. Carpenter	[218] [283]
26	John C. Chan	[57]
27	Chia-Lun Chang	[215]
28	Henry Chang	[167]
29	Hongtao P. Chang	[29]
30	Hoon Chang	[93] [94] [121]
31	Craig M. Chase	[130]
32	Abhijit Chatterjee	[37] [55] [65] [66] [77] [82] [88] [89] [92] [99] [101] [107] [110] [115] [132] [196] [202] [228] [246] [275]
33	Chien-Yi Chen	[34]
34	Chun-Hung Chen	[60] [68] [71]
35	Jin Chen	[113]
36	Timothy C. K. Chou	[6] [10] [26]
37	Chen-chau Chu	[153]
38	Ji Hwan (Paul) Chun	[202] [203] [208] [227] [232] [281] [295] [296]
39	Jaeyong Chung	[267] [277] [282] [286] [291] [293] [297] [305] [306] [310] [312] [313]
40	Robert F. Damiano	[83] [84]
41	Ramaswami Dandapani	[17]
42	Sachin Dileep Dasnurkar	[272] [289] [292]
43	Ramyanshu Datta	[204] [205] [210] [213] [218] [228] [245] [246] [283]
44	Edward S. Davidson	[23]
45	Bulent I. Dervisoglu	[103]
46	Sujit Dey	[137]
47	Abdulkadir Utku Diril	[228] [246]
48	Steve Dollens	[167]
49	Qingqi Dou	[225] [230] [249] [259]
50	Patrick A. Duba	[44]
51	E. Allen Emerson	[212] [231]
52	Zhenhai Fu	[234]
53	W. Kent Fuchs	[13] [28] [38] [58] [79]
54	Robert H. Fujii	[22] [30]
55	Masahiro Fujita	[117] [140] [150] [171]
56	Donald S. Fussell	[70] [74] [96] [102] [106] [109] [117] [122] [123] [140] [150] [171]
57	Daniel Gajski (Daniel D. Gajski)	[4]
58	Rajesh Galivanche	[262]
59	Jianhua Gan	[194] [207]
60	Gopi Ganapathy	[67] [91] [116]
61	Vijay K. Garg	[200]
62	Anne E. Gattiker (Anne Gattiker)	[302] [306]
63	Sergey Gavrilov	[253]
64	Gregorio Gervasio	[153]
65	Samaneh Gharahi	[273]
66	Ranjit Gharpurey	[240] [251] [268] [285]
67	Karl-Erwin Großpietsch (Karl-Erwin Grosspietsch)	[138]
68	Ravi Gupta	[204] [245]
69	Carol V. Gura	[45] [50]
70	S. Guramurthy	[214]
71	Sankar Gurumurthy	[222] [237] [241] [264] [270]
72	John F. Guzolek	[36]
73	Kihyuk Han	[279] [293] [297]
74	H. Hao	[124]
75	Yatin Vasant Hoskote	[73] [96] [105] [108] [109] [118] [122] [133]
76	Peter Y.-T. Hsu	[23]
77	Guanghui Hu	[153]
78	Shih-Hsin Hu	[274] [280] [308]
79	Kien A. Hua	[33]
80	Kuang-Hua Huang	[8] [13] [15]
81	Warren A. Hunt Jr.	[229]
82	C. Hunter	[124]
83	Tony Hurson	[153]
84	Sungbae Hwang	[175] [184] [187] [189]
85	Jawahar Jain	[70] [74] [102] [106] [117] [123] [140] [150] [171]
86	Eun Jung Jang	[302] [306]
87	Abhijit Jas	[262]
88	Rathish Jayabharathi	[115] [125] [143]
89	Kamalnayan Jayaraman	[177]
90	Niraj K. Jha	[20]
91	Jing-Yang Jou	[39] [41]
92	Vijay Kiran Kalyanam	[242]
93	Ghani A. Kanawati	[80] [104]
94	Nasser A. Kanawati	[80] [104]
95	S. Karako	[199]
96	Sankaran Karthik	[69] [76] [85] [119]
97	Nash Khouzam	[250]
98	Byoungho Kim	[217] [227] [232] [234] [250] [299] [301]
99	Hyunjin Kim	[291] [294] [307] [315]
100	Joonsoo Kim	[290] [309]
101	Kyoil Kim	[188]
102	Martin Kinkade	[153]
103	Fatih Kocan	[178]
104	Hans-Dieter Kochs	[138]
105	A. Kolhatkar	[201]
106	Arun Krishnamachary	[152] [168] [179] [183] [191]
107	Narayanan Krishnamurthy	[141] [155] [156] [166] [172] [198]
108	Jente B. Kuang	[205]
109	Andreas Kuehlmann	[182]
110	Rakesh Kumar	[275]
111	Ramachandra P. Kunda	[64]
112	Sandip Kundu	[103]
113	Parag K. Lala	[192]
114	Jae Wook Lee	[279] [281] [293] [295] [296] [297]
115	Joonsoo Lee	[290] [309]
116	Kyung Tek Lee	[125] [134] [144]
117	Songjun Lee	[162]
118	Marc E. Levitt	[46] [95] [103]
119	Chia-Pin R. Liu	[149]
120	Junsheng Long	[58] [63] [79]
121	Johannes Maier	[138]
122	Elie Maricau	[275]
123	M. J. Marlett	[40]
124	Andrew K. Martin	[155] [156] [166] [170] [211]
125	Glidden Martin	[119]
126	Mark McDermot	[276]
127	Chandler McDowell	[205]
128	Amit Mittal	[271]
129	Baker Mohammad	[256] [258] [311]
130	Robert K. Montoye	[205] [213]
131	John Moondanos	[75] [96] [122]
132	Dinos Moundanos	[106] [108] [118] [133] [135] [139] [148]
133	Robert B. Mueller-Thuns	[51] [52] [56] [59] [83] [84]
134	Rajarshi Mukherjee	[117] [140] [150] [171]
135	Naveena Nagi	[82] [88] [89] [92] [99] [107] [110] [132]
136	Ravindra Nair	[2]
137	Suku Nair (V. S. S. Nair)	[42] [43] [53] [54] [61] [73] [112] [141]
138	Haewoon Nam	[276] [287]
139	Prakash Narain	[64]
140	Sani R. Nassif	[213] [242] [263] [302] [306]
141	Suriyaprakash Natarajan	[264]
142	Lucie Nechanicka	[253]
143	Wayne M. Needham	[124]
144	Hung C. Ngo	[205]
145	Thomas M. Niermann	[72]
146	Clay Nordquist	[134]
147	Richard L. Norton	[7] [14]
148	Kevin J. Nowka	[205] [218] [228] [246] [283]
149	Sejang Oh	[279] [293] [297]
150	Michael Orshansky	[242]
151	Jen-Chieh Ou	[223] [243]
152	Rajendran Panda	[253] [255] [271]
153	Pankaj Pant	[115]
154	Chris Papachristou	[275]
155	Srinivasu Pappula	[119]
156	Joonsung Park	[224] [239] [248] [279] [282] [284] [286] [293] [297] [298]
157	Junyoung Park	[304] [314]
158	Janak H. Patel	[17] [72] [77] [103]
159	Srinivas Patil	[262]
160	Qiang Qiang	[215] [216] [219] [243]
161	Ashwin Raghunathan	[196] [202] [210] [283]
162	Joseph T. Rahmeh	[23] [25] [42] [51] [52] [53] [69]
163	Richard Raimi	[151]
164	Bharat Deep Rathi	[64]
165	Michel Renovell	[138]
166	Gordon Roberts	[167]
167	William A. Rogers	[21] [24] [29] [36] [44]
168	Jeongjin Roh	[145] [157] [159] [163] [186] [195]
169	Don E. Ross	[106]
170	Kaushik Roy	[42] [49] [53] [62] [95]
171	Rabindra K. Roy	[44] [72] [77]
172	Daniel G. Saab	[51] [52] [56] [59] [63] [78] [83] [84] [86] [100] [111] [161] [176] [178] [190] [215] [216] [219] [223] [235] [241] [243]
173	Youssef Saab	[78] [100] [111]
174	Avijit Saha	[164]
175	Martin Saint-Laurent	[256]
176	Sriram Sambamurthy	[220] [252] [270] [288]
177	Nina Saxena	[164]
178	Antony Sebastine	[204] [210] [245] [283]
179	Alper Sen	[200]
180	Suresh Seshadri	[163] [165]
181	Jian Shen	[129] [131] [136] [142] [153] [154]
182	Hsi-Ching Shih	[25] [35]
183	Hongjoong Shin	[196] [203] [209] [217] [224] [227] [232] [239] [248] [284] [298]
184	Adit D. Singh	[275]
185	Roman Solovyev	[253]
186	Mani Soma	[167]
187	Indira de Souza	[69]
188	Bob Stettler	[119]
189	Charles E. Stroud	[167]
190	Craig B. Stunkel	[42] [53]
191	Hector R. Sucar	[103]
192	Robert W. Sumners (Rob Sumners)	[128] [147] [160] [233]
193	Savithri Sundareswaran	[238] [253] [255] [271]
194	S. Surya	[97]
195	Earl E. Swartzlander Jr.	[98] [193] [287]
196	Koichiro Takayama	[140] [150] [171]
197	Rajeshwary Tayade	[238] [242] [244] [254] [260] [263] [266] [278]
198	Satish M. Thatte	[2] [3]
199	Kurt H. Thearling	[47]
200	Thomas Thomas	[87]
201	Whitney J. Townsend	[192] [193] [197]
202	Jiajin Tu	[221] [247]
203	Raghuram S. Tupuri	[126] [127] [152] [161] [168] [179] [185] [220] [252]
204	H. Mert Ustun	[314]
205	G. Vandling	[199] [201]
206	Shobha Vasudevan	[206] [212] [214] [221] [222] [231] [233] [236] [247] [265] [269]
207	Vivekananda M. Vedula	[173] [176] [177] [180] [185] [190] [197]
208	Ramtilak Vemu	[226] [237] [241] [257] [262] [264] [270] [300]
209	Praveen Vishakantaiah	[81] [86] [87] [90] [119]
210	Vinod Viswanath	[221] [229] [233] [236] [247] [265] [269]
211	Raymond P. Voith	[85]
212	Ron G. Walther	[103] [124]
213	Li-C. Wang	[199] [201]
214	Cheol-Jong Woo	[279] [286] [291] [293] [297]
215	Kun-Lung Wu	[28] [38]
216	Tung-Yeh Wu	[273] [280] [288] [308]
217	Jinjun Xiong	[305] [310] [312]
218	Shouli Yan	[194] [207]
219	Heebyung Yoon	[132]
220	Hak-soo Yu	[162] [174] [189] [203] [208] [209]
221	Jun Yuan	[129]
222	Mohamad A. Zeidan	[285]
223	Jing Zeng	[169] [181] [199] [201]
224	Chaoming Zhang	[240] [251] [268]
225	Yun Zhang	[271]
226	Hong Zheng	[110]
227	Hong Helena Zheng	[114]
228	Vladimir Zolotov	[305] [310] [312]
229	Yervant Zorian	[137]
230	Manuel A. d'Abreu	[77] [103] [119] [120] [143] [204] [245]