 | 2010 |
|---|
| 9 |       | John Ferguson,
Sandeep Koranne,
David Abercrombie:
An innovative method to automate the waiver of IP-level DRC violations.
ISQED 2010: 493-498 |
| 2009 |
|---|
| 8 | | David Abercrombie,
Fedor Pikus,
Cosmin Cazan:
Use of lithography simulation for the calibration of equation-based design rule checks.
DAC 2009: 67-70 |
| 2008 |
|---|
| 7 | | Manish Sharma,
Brady Benware,
Lei Ling,
David Abercrombie,
Lincoln Lee,
Martin Keim,
Huaxing Tang,
Wu-Tung Cheng,
Ting-Pu Tai,
Yi-Jung Chang,
Reinhart Lin,
Albert Mann:
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.
ITC 2008: 1-9 |
| 2006 |
|---|
| 6 | | David Abercrombie,
Bernd Koenemann,
Nagesh Tamarapalli,
Srikanth Venkataraman:
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.
VLSI Design 2006: 14 |
| 2005 |
|---|
| 5 | | Jay Jahangiri,
David Abercrombie:
Meeting Nanometer DPM Requirements Through DFT.
ISQED 2005: 276-282 |
| 4 | | Jay Jahangiri,
David Abercrombie:
Value-Added Defect Testing Techniques.
IEEE Design & Test of Computers 22(3): 224-231 (2005) |
| 2004 |
|---|
| 3 | | Manu Rehani,
David Abercrombie,
Robert Madge,
Jim Teisher,
Jason Saw:
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.
ITC 2004: 181-189 |
| 2002 |
|---|
| 2 | | David Turner,
David Abercrombie,
James McNames,
W. Robert Daasch,
Robert Madge:
Isolating and Removing Sources of Variation in Test Data.
ITC 2002: 464-471 |
| 1997 |
|---|
| 1 | | David Abercrombie,
Guy G. Gable:
Industry-Government Collaboration: Queensland 's IT&T Strategy and the Information Industries Board.
PACIS 1997: 63 |
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