Haruhiko Abe

	1996
1		Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe: A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. ITC 1996: 319-324

Coauthor Index

1	Mitsuhiro Hamada	[1]
2	Shinji Komori	[1]
3	Kazuo Kyuma	[1]
4	Fumihiro Okuda	[1]
5	Narumi Sakashita	[1]
6	Hiroki Shimano	[1]
7	Ken'ichi Shimomura	[1]
8	Tetsuo Tada	[1]
9	Akihiko Yasuoka	[1]

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