Abdessatar Abderrahman

	1999
4		Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 18(3): 332-345 (1999)
	1997
3		Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: CLP-based Multifrequency Test Generation for Analog Circuits. VTS 1997: 158-165
	1996
2		Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny: Optimization-based multifrequency test generation for analog circuits. J. Electronic Testing 9(1-2): 59-73 (1996)
	1994
1		Abdessatar Abderrahman, Bozena Kaminska, Yvon Savaria: Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits. EDAC-ETC-EUROASIC 1994: 658

Coauthor Index

1	Eduard Cerny	[2] [3] [4]
2	Bozena Kaminska	[1] [2] [3] [4]
3	Yvon Savaria	[1]

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