Mohamed A. Abdelrahman

	2011
3		Mohamed A. Abdelrahman, Ankush Gupta, Wael A. Deabes: A Feature-Based Solution to Forward Problem in Electrical Capacitance Tomography of Conductive Materials. IEEE T. Instrumentation and Measurement 60(2): 430-441 (2011)
	2010
2		Yogesh D. Barve, Mohamed A. Abdelrahman, Wael A. Deabes: Integrated Technique for Data Transmission Reliability in Metal Fill Monitoring Using Wireless Sensor Network. ITNG 2010: 903-907
	2008
1		Phaneeth K. R. Junga, Mohamed A. Abdelrahman, Clayton Thurmer, Wael A. Deabes: Reliable Metal-Fill Monitoring System Using Wireless Sensor Networks. ITNG 2008: 1284-1285

Coauthor Index

1	Yogesh D. Barve	[2]
2	Wael A. Deabes	[1] [2] [3]
3	Ankush Gupta	[3]
4	Phaneeth K. R. Junga	[1]
5	Clayton Thurmer	[1]

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