 | 2011 |
| 10 |  | Mohamed Abbas,
Takahiro J. Yamaguchi,
Yasuo Furukawa,
Satoshi Komatsu,
Kunihiro Asada:
Novel technique for minimizing the comparator delay dispersion in 65nm CMOS technology.
ICECS 2011: 220-223 |
| 9 |  | Takahiro J. Yamaguchi,
Mohamed Abbas,
Mani Soma,
Takafumi Aoki,
Yasuo Furukawa,
Katsuhiko Degawa,
Satoshi Komatsu,
Kunihiro Asada:
An equivalent-time and clocked approach for continuous-time quantization.
ISCAS 2011: 2529-2532 |
| 8 |  | Takahiro J. Yamaguchi,
Mani Soma,
Takafumi Aoki,
Yasuo Furukawa,
Katsuhiko Degawa,
Kunihiro Asada,
Mohamed Abbas,
Satoshi Komatsu:
Application of a continuous-time level crossing quantization method for timing noise measurements.
ITC 2011: 1-10 |
| 2010 |
| 7 |  | Mohamed Abbas,
Kwang-Ting Cheng,
Yasuo Furukawa,
Satoshi Komatsu,
Kunihiro Asada:
An automatic test generation framework for digitally-assisted adaptive equalizers in high-speed serial links.
DATE 2010: 1755-1760 |
| 2009 |
| 6 |  | Mohamed Abbas,
Kwang-Ting Cheng,
Yasuo Furukawa,
Satoshi Komatsu,
Kunihiro Asada:
Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links.
European Test Symposium 2009: 107-112 |
| 2006 |
| 5 |  | Mohamed Abbas,
Makoto Ikeda,
Kunihiro Asada:
On-chip 8GHz non-periodic high-swing noise detector.
DATE 2006: 670-671 |
| 4 |  | Mohamed Abbas,
Makoto Ikeda,
Kunihiro Asada:
Statistical Model for Logic Errors in CMOS Digital Circuits for Reliability-Driven Design Flow.
DDECS 2006: 147-148 |
| 3 |  | Mohamed Abbas,
Makoto Ikeda,
Kunihiro Asada:
On-Chip Detector for Single-Event Noise Sensing with Voltage Scaling Function.
IEICE Transactions 89-C(3): 370-376 (2006) |
| 2 |  | Mohamed Abbas,
Makoto Ikeda,
Kunihiro Asada:
Noise Immunity Investigation of Low Power Design Schemes.
IEICE Transactions 89-C(8): 1238-1247 (2006) |
| 2004 |
| 1 |  | Mohamed Abbas,
Makoto Ikeda,
Kunihiro Asada:
Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime.
DFT 2004: 87-95 |