Philipp Öhler

	2008
3		Philipp Öhler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand: A Modular Memory BIST for Optimized Memory Repair. IOLTS 2008: 171-172
	2007
2		Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. DDECS 2007: 185-190
1		Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. European Test Symposium 2007: 91-96

Coauthor Index

1	Alberto Bosio	[3]
2	Sybille Hellebrand	[1] [2] [3]
3	Giorgio Di Natale	[3]
4	Hans-Joachim Wunderlich	[1] [2]

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