VTS 2011: Dana Point, CA, USA

• Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir:
  Understanding customer returns from a test perspective. 2-7
  
• Mohammad Hossein Neishaburi, Zeljko Zilic:
  A distributed AXI-based platform for post-silicon validation. 8-13
  
• Kanad Basu, Prabhat Mishra:
  Efficient trace data compression using statically selected dictionary. 14-19
  
• Yu-Jen Huang, Jin-Fu Li, Ji-Jan Chen, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu:
  A built-in self-test scheme for the post-bond test of TSVs in 3D ICs. 20-25
  
• Shreepad Panth, Sung Kyu Lim:
  Scan chain and power delivery network synthesis for pre-bond test of 3D ICs. 26-31
  
• Eshan Singh:
  Exploiting rotational symmetries for improved stacked yields in W2W 3D-SICs. 32-37
  
• Saghir Shaikh:
  Test and characterization of high-speed circuits. 38
  
• Samah Mohamed Saeed, Ozgur Sinanoglu:
  Expedited response compaction for scan power reduction. 40-45
  
• Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma:
  Leakage power profiling and leakage power reduction using DFT hardware. 46-51
  
• Zhongwei Jiang, Zheng Wang, Jing Wang, D. M. H. Walker:
  Levelized low cost delay test compaction considering IR-drop induced power supply noise. 52-57
  
• Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
  Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. 58-63
  
• Suraj Sindia, Vishwani D. Agrawal, Virendra Singh:
  Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients. 64-69
  
• Takushi Hashida, Yuuki Araga, Makoto Nagata:
  A diagnosis testbench of analog IP cores against on-chip environmental disturbances. 70-75
  
• Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor:
  Case Study: Efficient SDD test generation for very large integrated circuits. 78-83
  
• Irith Pomeranz:
  Static test compaction for delay fault test sets consisting of broadside and skewed-load tests. 84-89
  
• Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham:
  Efficient and product-representative timing model validation. 90-95
  
• Yasuo Sato:
  Special session: Multifaceted approaches for field reliability. 96
  
• Mike Laisne:
  Advanced methods for leveraging new test standards. 97
  
• Siddharth Garg, Diana Marculescu:
  Special session 4A: New topics parametric yield and reliability of 3D integrated circuits: New challenges and solutions. 99
  
• Kurt Rosenfeld, Ramesh Karri:
  Security-aware SoC test access mechanisms. 100-104
  
• Jeyavijayan Rajendran, Vinayaka Jyothi, Ozgur Sinanoglu, Ramesh Karri:
  Design and analysis of ring oscillator based Design-for-Trust technique. 105-110
  
• Suriyaprakash Natarajan, Arani Sinha:
  The buck stops with wafer test: Dream or reality? 111
  
• Kee Sup Kim, Rob Roy:
  Apprentice - VTS edition: Season 4. 113
  
• Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg:
  Special session 5B: Panel How much toggle activity should we be testing with? 114
  
• Amitava Majumdar, Arani Sinha, Nehal Patel, Ramamurthy Setty, Yan Dong, Shu-Hsuan Chou:
  A Novel mechanism for speed characterization during delay test. 116-121
  
• Seongmoon Wang:
  An efficient method to screen resistive opens under presence of process variation. 122-127
  
• Irith Pomeranz:
  On clustering of undetectable transition faults in standard-scan circuits. 128-133
  
• Rudrajit Datta, Nur A. Touba:
  Designing a fast and adaptive error correction scheme for increasing the lifetime of phase change memories. 134-139
  
• Valentin Gherman, Samuel Evain, Fabrice Auzanneau, Yannick Bonhomme:
  Programmable extended SEC-DED codes for memory errors. 140-145
  
• Hsiu-Chuan Shih, Ching-Yi Chen, Cheng-Wen Wu, Chih-He Lin, Shyh-Shyuan Sheu:
  Training-based forming process for RRAM yield improvement. 146-151
  
• Arani Sinha, Suriyaprakash Natarajan:
  The bang for the buck with resiliency: Yield or field? 152
  
• Prakash Narayanan, Rajesh Mittal, Sumanth Poddutur, Vivek Singhal, Puneet Sabbarwal:
  Modified flip-flop architecture to reduce hold buffers and peak power during scan shift operation. 154-159
  
• Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty:
  Power-safe test application using an effective gating approach considering current limits. 160-165
  
• Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor:
  Power-aware test generation with guaranteed launch safety for at-speed scan testing. 166-171
  
• Wing Chiu Tam, Ronald D. Blanton:
  SLIDER: A fast and accurate defect simulation framework. 172-177
  
• Ender Yilmaz, Anne Meixner, Sule Ozev:
  An industrial case study of analog fault modeling. 178-183
  
• Jesus Moreno, Víctor H. Champac, Michel Renovell:
  A new methodology for realistic open defect detection probability evaluation under process variations. 184-189
  
• Julien Guilhemsang, Olivier Héron, Nicolas Ventroux, Olivier Goncalves, Alain Giulieri:
  Impact of the application activity on intermittent faults in embedded systems. 191-196
  
• Sreenivas Gangadhar, Spyros Tragoudas:
  An analytical method for estimating SET propagation. 197-202
  
• C. V. Martins, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
  Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. 203-208
  
• Jeffrey F. Wheeldon:
  Calibrated high-efficiency testing and modelling methodologies for concentrated multi-junction solar cells. 209
  
• Shobha Vasudevan:
  Coverage closure in SoC verification: Are we chasing a mirage? 211
  
• Kyoung Youn Cho, Rajagopalan Srinivasan:
  A scan cell architecture for inter-clock at-speed delay testing. 213-218
  
• Amit Sanghani, Bo Yang, Karthikeyan Natarajan, Chunsheng Liu:
  Design and implementation of a time-division multiplexing scan architecture using serializer and deserializer in GPU chips. 219-224
  
• Dilip K. Bhavsar:
  Harmony Widget for X-free scan testing. 225-228
  
• Zhen Zhang, Dimitri Refauvelet, Alain Greiner, Mounir Benabdenbi, François Pêcheux:
  Localization of damaged resources in NoC based shared-memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure. 229-234
  
• Michail Maniatakos, Yiorgos Makris, Prabhakar Kudva, Bruce M. Fleischer:
  Exponent monitoring for low-cost concurrent error detection in FPU control logic. 235-240
  
• Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal:
  Enhancing online error detection through area-efficient multi-site implications. 241-246
  
• Priyadharshini Shanmugasundaram, Vishwani D. Agrawal:
  Dynamic scan clock control for test time reduction maintaining peak power limit. 248-253
  
• Baosheng Wang, Jayalakshmi Rajaraman, Kanwaldeep Sobti, Derrick Losli, Jeff Rearick:
  Structural tests of slave clock gating in low-power flip-flop. 254-259
  
• Nader Alawadhi, Ozgur Sinanoglu:
  Revival of partial scan: Test cube analysis driven conversion of flip-flops. 260-265
  
• Dongsoo Lee, Sang Phill Park, Ashish Goel, Kaushik Roy:
  Memory-based embedded digital ATE. 266-271
  
• Songwei Pei, Huawei Li, Xiaowei Li:
  A unified test architecture for on-line and off-line delay fault detections. 272-277
  
• Ujjwal Guin, Chen-Huan Chiang:
  Design for Bit Error Rate estimation of high speed serial links. 278-283
  
• Srinivasulu Alampally, R. T. Venkatesh, P. Shanmugasundaram, Rubin A. Parekhji, V. D. Agrawal:
  An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. 285-290
  
• Kameshwar Chandrasekar, Surendra Bommu, Sanjay Sengupta:
  Low Coverage Analysis using dynamic un-testability debug in ATPG. 291-296
  
• Jia Li, Yu Huang, Dong Xiang:
  Prediction of compression bound and optimization of compression architecture for linear decompression-based schemes. 297-302
  
• Yasuhiro Takahashi, Akinori Maeda:
  Multi Domain Test: Novel test strategy to reduce the Cost of Test. 303-308
  
• Junxia Ma, Nisar Ahmed, Mohammad Tehranipoor:
  Low-cost diagnostic pattern generation and evaluation procedures for noise-related failures. 309-314
  
• W.-A. Lin, C.-C. Lee, J.-L. Huang:
  Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs. 315-320
  
• Hideo Okawara:
  Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -. 322
  
• LeRoy Winemberg, Mohammad Tehranipoor:
  Special session: Hot topic: Smart silicon. 323
  
• Anne Gattiker:
  Invited paper: Yin and Yang of embedded sensors for post-scaling-era. 324-327
  
• Cheng-Wen Wu:
  Special session: Hot topic design and test of 3D and emerging memories. 328
  

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