VTS 2009:
Santa Cruz, CA, USA
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conf/vts/ManiatakosKTJM09 export record as
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conf/vts/HouarcheCRCEPB09 export record as
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Haluk Konuk :
Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing.
33-38
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Kee Sup Kim :
Panel: Apprentice - VTS Edition: Season 2.
119
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Haluk Konuk :
DFT and Test Problems from the Trenches.
120
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Keith A. Jenkins ,
Lionel Li :
A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset.
185-188
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conf/vts/KhocheKLLAPZLRZ09 export record as
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Naveen Velamati ,
Robert Daasch :
Analytical Model for Multi-site Efficiency with Parallel to Serial Test Times, Yield and Clustering.
270-275
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Unni Chandran ,
Dan Zhao :
SS-KTC: A High-Testability Low-Overhead Scan Architecture with Multi-level Security Integration.
321-326
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Bhanu Kapoor :
Special Session 11C: Embedded Tutorial: System-on-a-Chip Power Management Implications on Validation and Testing.
333
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Andrew Piziali :
Panel: Functional Verification Planning and Management - Are Good Intentions Good Enough?
338
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