VISION 2005:
Las Vegas,
Nevada,
USA
Hamid R. Arabnia (Ed.):
Proceedings of The 2005 International Conference on Computer Vision, VISION 2005, Las Vegas, Nevada, USA, June 20-23, 2005.
CSREA Press 2005, ISBN 1-932415-65-3 
3D Vision - Stereo & Warping
Motion Tracking & Object Recognition
- Lihong Zheng, Xiangjian He, Yuanzong Li:
A Comparison of Methods for Character Recognition of Car Number Plates.
33-39
- John G. Allen, Richard Y. D. Xu, Jesse S. Jin:
Dependence Testing and Vectorization of Multimedia Agents.
40-46
- Yunlian Sun, Li Wang:
Application of Independent Component Analysis to Financial Time Series Pattern Recognition.
47-51
- Tom Hintz, Huaqing Wang, Phil Sheridan:
Variable Resolution Foveation on the Spiral Architecture.
52-57
- Xiangjian He, Tom Hintz, Qiang Wu, Lihong Zheng:
Number Recognition Using Inductive Learning on Spiral Architecture.
58-64
Low- & High-Level Segmentation + Classification + Detection
Image Compression
Databases + Feature Extraction
Recognition
Algorithms & Applications
- Maria B. Teruel, Kristal L. Sauer, Evangelos A. Yfantis, Ramzi W. Elkhater:
A Novel Approach to Camera Calibration as Part of an HCI System.
165-171
- Dietmar Wippig, Bernd Klauer, Hans Christoph Zeidler:
Extraction of Ship Silhouettes Using Active Contours from Infrared Images.
172-177
- Emilio Martínez Expósito, Perfecto Mariño Espiñeira, Vicente Pastoriza Santos, Miguel Santamaría Sánchez:
Easy Open Can End Inspection Using UV Black Light.
178-184
- Ahmed Al-Jaber, Raja' S. Alomari:
An Alternative Data Hiding Technique for Grayscale and Color Images.
185-191
- Rongbin Liu, Changshui Zhang, Yinglong Xia:
Importance Feature Sampling in Random Subspace.
192-197
- Milenko Carapic, Golshah Naghdy:
Assesment of the Underwater Vision System Based on Logarithmic Response CMOS Sensor and Gray Scale CCD Sensor.
198-204
- Rahman Tashakkori, John M. Tyler, Oleg S. Pianykh:
Medical Image Optimal Wavelets.
205-211
- Monica A. Trifas, John M. Tyler, Oleg S. Pianykh:
Medical Image Enhancement.
212-218
- Hean-Teik Chuah, Nidal S. Kamel, Kok-Swee Sim:
The Scanning Electron Microscope (SEM) Assessment System Using The Autoregressive (AR) Technique.
219-225
- Kep Pen Yan, Yik Yee Tab:
Application of Fluorescence Microscopy for Semiconductor Packaging Analysis.
226-231
- Cheng Zheng, Yik Yee Tan, Shyamala Pillay, Johthi P. Tambusamy, Kok-Swee Sim:
Application of Real-time Contrast Enhancement Techniques on Scanning Electron Microscope (SEM) Images.
232-240
Late Papers
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