SSIRI 2008: Yokohama, Japan

• Clifford C. Juan, James Bret Michael, Christopher S. Eagle:
  Vulnerability Analysis of HD Photo Image Viewer Applications. 1-7
  
• Warren W. Lin, Shiuhpyng Shieh, Jia-Chun Lin:
  A Pollution Attack Resistant Multicast Authentication Scheme Tolerant to Packet Loss. 8-15
  
• Sylvain Guilley, Laurent Sauvage, Jean-Luc Danger, Tarik Graba, Yves Mathieu:
  Evaluation of Power-Constant Dual-Rail Logic as a Protection of Cryptographic Applications in FPGAs. 16-23
  
• Yu Liu, Hong Zhu:
  An Experimental Evaluation of the Reliability of Adaptive Random Testing Methods. 24-31
  
• Shin Kimoto, Tatsuhiro Tsuchiya, Tohru Kikuno:
  Pairwise Testing in the Presence of Configuration Change Cost. 32-38
  
• Hyuncheol Park, Hoyeon Ryu, Jongmoon Baik:
  Historical Value-Based Approach for Cost-Cognizant Test Case Prioritization to Improve the Effectiveness of Regression Testing. 39-46
  
• Doron Drusinsky, James Bret Michael, Thomas W. Otani, Man-tak Shing:
  Validating UML Statechart-Based Assertions Libraries for Improved Reliability and Assurance. 47-51
  
• Mohammad Reza Selim, Yuichi Goto, Jingde Cheng:
  Ensuring Reliability and Availability of Soft System Bus. 52-59
  
• Yoshinobu Tamura, Shigeru Yamada:
  A Method of Reliability Assessment Based on Deterministic Chaos Theory for an Open Source Software. 60-66
  
• Sang-Moon Ryu:
  Reliability Improvement of Real-Time Embedded System Using Checkpointing. 67-72
  
• Koichi Tokuno, Shigeru Yamada:
  Dynamic Performance Analysis for Software System Considering Real-Time Property in Case of NHPP Task Arrival. 73-80
  
• Valdivino A. Santiago, Wendell Pereira da Silva, N. L. Vijaykumar:
  Shortening Test Case Execution Time for Embedded Software. 81-88
  
• Wei-Hung Lin, Yuh-Rau Wang, Shi-Jinn Horng:
  A Blind Watermarking Scheme Based on Wavelet Tree Quantization. 89-95
  
• Che-Cheng Lin, Shiuhpyng Shieh, Jia-Chun Lin:
  Lightweight, Distributed Key Agreement Protocol for Wireless Sensor Networks. 96-102
  
• Peter Zoeteweij, Jurryt Pietersma, Rui Abreu, Alexander Feldman, Arjan J. C. van Gemund:
  Automated Fault Diagnosis in Embedded Systems. 103-110
  
• Kazuyuki Suzuki, Mesbahul Alam, Takuji Yoshikawa, Wataru Yamamoto:
  Two Methods for Estimating Product Lifetimes from only Warranty Claims Data. 111-119
  
• Pei-Chen Tseng, Jiun-Kuei Shiung, Chun-Ting Huang, Shih-Mine Guo, Wen-Shyang Hwang:
  Adaptive Car Plate Recognition in QoS-Aware Security Network. 120-127
  
• Woei-Kae Chen, Zheng-Wen Shen, Che-Ming Chang:
  GUI Test Script Organization with Component Abstraction. 128-134
  
• Jooyoung Seo, Yuhoon Ki, Byoungju Choi, Kwanghyun La:
  Which Spot Should I Test for Effective Embedded Software Testing?. 135-142
  
• Mohammad Shokrollah-Shirazi, Seyed Ghassem Miremadi:
  FPGA-Based Fault Injection into Synthesizable Verilog HDL Models. 143-149
  
• Shinji Inoue, Shigeru Yamada:
  Two-Dimensional Software Reliability Assessment with Testing-Coverage. 150-157
  
• Hideki Nagatsuka:
  A Study of Estimation for the Three-Parameter Weibull Distribution Based on Doubly Type-II Censored Data Using a Least Squares Method. 158-165
  
• Masato Uwajima, Toru Sasaki, Chisa Takano, Masaki Aida:
  Proposal for a Communication Link Model Based on Resonance Frequency of Network Users. 166-172
  
• Yasuhiro Fujihara, Hitomi Oikawa, Yuko Murayama:
  Towards an Interface causing Discomfort for Security: A User Survey on the Factors of Discomfort. 173-174
  
• Chih-Hung Chang, Chih-Wei Lu, William C. Chu:
  Improving Software Integration from Requirement Process with a Model-Based Object-Oriented Approach. 175-176
  
• K. Saravana Kumar, R. B. Misra:
  An Enhanced Model for Early Software Reliability Prediction Using Software Engineering Metrics. 177-178
  
• Koichiro Sato, Yoshiki Ujiie, Yoshiyuki Matsuoka:
  Application to Artificial Hip Stem Design of an Emergent Design System Applicable in the Early Process of Design. 179-180
  
• Subramanyam Ranganathan, Cvetan Redzic:
  Application of Design for Six Sigma in Third Party Intensive Programs. 181-182
  
• Norman F. Schneidewind, Michael G. Hinchey:
  Risk-Driven Software Reliability and Testing. 183-184
  
• Fengzhong Zou, Joseph Davis:
  A Model of Bug Dynamics for Open Source Software. 185-186
  
• Nikhil Damle, Avinash G. Keskar:
  Co-Simulation of Networked Embedded System: Verification Approach. 187-188
  
• Shwu-Huey Yen, Chun-Wei Wang, Jih Pin Yeh, Meng-Ju Lin, Hwei-Jen Lin:
  Text Extraction in Video Images. 189-190
  
• Nobuyuki Nishiuchi, Kimihiro Yamanaka, Kunie Beppu:
  A Study of Visibility Evaluation for the Combination of Character Color and Background Color on a Web Page. 191-192
  
• Ruoying Sun, Xingfen Wang, Gang Zhao:
  An Ant Colony Optimization Approach to Multi-Objective Supply Chain Model. 193-194
  
• K. Saravana Kumar, Ravindra Babu Misra, Neeraj Kumar Goyal:
  Development of Fuzzy Software Operational Profile. 195-196
  
• Tadahiro Shibutani, Qiang Yu, Masaki Shiratori:
  Effect of Creep Properties on Pressure Induced Tin Whisker Formation. 197-198
  
• Samuel Keene:
  Design of Experiments is the "Sweet Spot" of Six Sigma. 199-200
  
• Eunjee Song, Nathan V. Roberts:
  Verifiable Aspect Composition in UML Models. 201-202
  
• Yongbin Zhou, Jun Yang, Yueke Wang:
  A New Method for Measuring Single Event Effect Susceptibility of L1 Cache Unit. 203-204
  
• Shuichi Fukuda:
  Detecting Emotions and Dangerous Actions for Better Human-System Team Working. 205-206
  
• Nobuyuki Tamura, Tetsushi Yuge, Shigeru Yanagi:
  Estimation of the Change Point for Failure-Censored Data via Bayesian Information Criterion. 207-208
  
• Nico Wolf, Jan C. Aurich:
  Dependable Mechatronic Products: Closing the Intelligence Gap. 209-210
  
• Kun-Chun Chang, Yi-Chinag Wang, Chung-Hsien Hsu, Kuen-Long Leu, Yung-Yuan Chen:
  System-Bus Fault Injection Framework in SystemC Design Platform. 211-212
  
• Haruka Nakao, Robert Eschbach:
  Strategic Usage of Test Case Generation by Combining Two Test Case Generation Approaches. 213-214
  
• Hideo Kohinata, Masayuki Arai, Satoshi Fukumoto:
  An Experimental Study on Latch Up Failure of CMOS LSI. 215-216
  
• Vasile Anghel:
  Conception for Integrated Availability in Design for the Nuclear Systems. 217-223
  
• Yung-Yuan Chen, Shu-Hao Hsu, Kuen-Long Leu:
  An Estimation Model of Vulnerability for Embedded Microprocessors. 224-225
  
• Wangbong Lee, Boo-Geum Jung, Jongmoon Baik:
  Early Reliability Prediction: An Approach to Software Reliability Assessment in Open Software Adoption Stage. 226-227
  
• Shih-En Chien, I-Ta Cherng, Chih-Wen Liu:
  Automation of Look-Up Tables for System Integrity Protection Systems in Taiwan Power System. 228-229
  
• Hwei-Jen Lin, Shwu-Huey Yen, Jih Pin Yeh, Meng-Ju Lin:
  Face Detection Based on Skin Color Segmentation and SVM Classification. 230-231
  

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