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29th NATW 2020: Albany, NY, USA

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29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020. IEEE 2020, ISBN 978-1-7281-9699-2
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Stephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome:
Passive Intermodulation (PIM) Test and Measurement. 1-3
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Naznin Akter, Mustafa Karabiyik, Michael S. Shur, John Suarez, Nezih Pala:
AI Powered THz VLSI Testing Technology. 1-5
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Konstantinos Poulos, Themistoklis Haniotakis:
A Built In Test circuit for waveform classification at high frequencies. 1-5
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Marcia Golmohamadi, Ryan Jurasek, Wolfgang Hokenmaier, Donald Labrecque, Ruoyu Zhi, Bret Dale, Nibir Islam, Dave Kinney, Angela Johnson:
Verification and Testing Considerations of an In-Memory AI Chip. 1-6
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Stewart E. Rauch, Dongho Lee, Alexey Vert, Roy Gupta:
Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. 1-4
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Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min:
Self-heating characterization and its applications in technology development. 1-7
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Joshua Immanuel, Spencer K. Millican:
Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion. 1-6

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