11th IEEE International Symposium on Software Metrics (METRICS 2005), 19-22 September 2005, Como Italy. IEEE Computer Society 2005 ISBN 0-7695-2371-4 [ contents ]
10th IEEE International Software Metrics Symposium (METRICS 2004), 11-17 September 2004, Chicago, IL, USA. IEEE Computer Society 2004 ISBN 0-7695-2129-0 [ contents ]
9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia. IEEE Computer Society 2003 ISBN 0-7695-1987-3 [ contents ]
8. IEEE METRICS 2002: Ottawa, Canada
8th IEEE International Software Metrics Symposium (METRICS 2002), 4-7 June 2002, Ottawa, Canada. IEEE Computer Society 2002 ISBN 0-7695-1339-5 [ contents ]
7. IEEE METRICS 2001: London, England
7th IEEE International Software Metrics Symposium (METRICS 2001), 4-6 April 2001, London, England. IEEE Computer Society 2001 ISBN 0-7695-1043-4 [ contents ]
6. IEEE METRICS 1999: Boca Raton, FL, USA
6th IEEE International Software Metrics Symposium (METRICS 1999), 4-6 November 1999, Boca Raton, FL, USA. IEEE Computer Society 1999 ISBN 0-7695-0403-5 [ contents ]
5. IEEE METRICS 1998: Bethesda, Maryland, USA
5th IEEE International Software Metrics Symposium (METRICS 1998), March 20-21, 1998, Bethesda, Maryland, USA. IEEE Computer Society 1998 [ contents ]
4. IEEE METRICS 1997: Albuquerque, NM, USA
4th IEEE International Software Metrics Symposium (METRICS 1997), November 5-7, 1997, Albuquerque, NM, USA. IEEE Computer Society 1997 [ contents ]
3. IEEE METRICS 1996: Berlin, Germany
3rd IEEE International Software Metrics Symposium (METRICS 1996), From Measurement to Empirical Results, March 25-26, 1996, Berlin, Germany. IEEE Computer Society 1996 [ contents ]
2. IEEE METRICS 1994: London, UK
Proceedings of the 1994 IEEE 2nd International Software Metrics Symposium, October 24-26, 1994, London, England, UK. IEEE 1994 ISBN 0-8186-5865-7 [ contents ]
1. IEEE METRICS 1993: Balimore, Maryland, USA
Proceedings of the First International Software Metrics Symposium, METRICS 1993, May 21-22, 1993, Balimore, Maryland, USA. IEEE 1993 ISBN 0-8186-3740-4 [ contents ]