Douglas Young, Nur A. Touba (Eds.):
2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008.
IEEE 2008, ISBN 978-1-4244-2403-0
Mike Lydon: Managing Test in the End-to-End, Mega Supply Chain.
Jan N. Rabaey: Computing at the Crossroads (And What Does it Mean to Verification and Test?).
data released under the ODC-BY 1.0 license
