International Test Conference (ITC)
ITC Home Page
ITC 2011: Anaheim, CA, USA
Bill Eklow, R. D. (Shawn) Blanton (Eds.):
2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011.
IEEE 2011, ISBN 978-1-4577-0153-5
Contents 
ITC 2010: Austin, TX, USA
Ron Press, Erik H. Volkerink (Eds.):
2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010.
IEEE 2010, ISBN 978-1-4244-7206-2
Contents
ITC 2009: Austin, TX, USA
Gordon W. Roberts, Bill Eklow (Eds.):
2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009.
IEEE 2009, ISBN 978-1-4244-4868-5
Contents
ITC 2008: Santa Clara, California, USA
Douglas Young, Nur A. Touba (Eds.):
2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008.
IEEE 2008, ISBN 978-1-4244-2403-0
Contents
ITC 2007: Santa Clara, California, USA
Jill Sibert, Janusz Rajski (Eds.):
2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007.
IEEE 2007, ISBN 1-4244-1128-9
Contents
ITC 2006: Santa Clara, California, USA
Scott Davidson, Anne Gattiker (Eds.):
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006.
IEEE 2006, ISBN 1-4244-0292-1
Contents
ITC 2005: Austin, TX, USA
Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005.
IEEE 2005, ISBN 0-7803-9038-5
Contents
ITC 2004: Charlotte, NC, USA
Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA.
IEEE 2003, ISBN 0-7803-8581-0
Contents
ITC 2003: Charlotte, NC, USA
Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA.
IEEE Computer Society 2003, ISBN 0-7803-8106-8
Contents
ITC 2002: Baltimore, MD, USA
Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002.
IEEE Computer Society 2002
Contents
ITC 2001: Baltimore, MD, USA
Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001.
IEEE Computer Society 2001, ISBN 0-7803-7169-0
Contents
ITC 2000: Atlantic City, NJ, USA
Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000.
IEEE Computer Society 2000
Contents
ITC 1999: Atlantic City, NJ, USA
Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999.
IEEE Computer Society 1999
Contents
ITC 1998: Washington, DC, USA
Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998.
IEEE Computer Society 1998, ISBN 0-7803-5093-6
Contents
ITC 1997: Washington, DC, USA
Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997.
IEEE Computer Society 1997, ISBN 0-7803-4209-7
Contents
ITC 1996: Washington, DC, USA
Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996.
IEEE Computer Society 1996, ISBN 0-7803-3541-4
Contents
ITC 1995: Washington, DC, USA
Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995.
IEEE Computer Society 1995, ISBN 0-7803-2992-9
Contents
ITC 1994: Washington, DC, USA
Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994.
IEEE Computer Society 1994, ISBN 0-7803-2103-0
Contents
ITC 1993: Baltimore, MD, USA
Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993.
IEEE Computer Society 1993, ISBN 0-7803-1430-1
Contents
ITC 1992: Baltimore, MD, USA
Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992.
IEEE Computer Society 1992, ISBN 0-7803-0760-7
Contents
ITC 1991: Nashville, TN, USA
Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991.
IEEE Computer Society 1991, ISBN 0-8186-9156-5
Contents
ITC 1990: Washington, DC, USA
Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990.
IEEE Computer Society 1990, ISBN 0-8186-9064-
Contents
ITC 1989: Washington, D.C., USA
Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989.
IEEE Computer Society 1989
Contents
ITC 1988: Washington, D.C., USA
Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988.
IEEE Computer Society 1988
Contents
ITC 1986: Washington, D.C., USA
Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986.
IEEE Computer Society 1986
Contents
ITC 1985: Philadelphia, PA, USA
Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985.
IEEE Computer Society 1985
Contents
ITC 1984: Philadelphia, PA, USA
Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984.
IEEE Computer Society 1984
Contents
ITC 1983: Philadelphia, PA, USA
Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983.
IEEE Computer Society 1983
Contents
ITC 1982: Philadelphia, PA, USA
Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982.
IEEE Computer Society 1982
Contents
ITC 1981: Philadelphia, PA, USA
Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981.
IEEE Computer Society 1981
Contents
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