ITC Home Page

ITC 2012: Anaheim, CA, USA

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  2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. IEEE Computer Society 2012 ISBN 978-1-4673-1594-4 [ contents ]

ITC 2011: Anaheim, CA, USA

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  Bill Eklow, R. D. (Shawn) Blanton (Eds.): 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. IEEE 2011 ISBN 978-1-4577-0153-5 [ contents ]

ITC 2010: Austin, TX, USA

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  Ron Press, Erik H. Volkerink (Eds.): 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. IEEE 2010 ISBN 978-1-4244-7206-2 [ contents ]

ITC 2009: Austin, TX, USA

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  Gordon W. Roberts, Bill Eklow (Eds.): 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. IEEE 2009 ISBN 978-1-4244-4868-5 [ contents ]

ITC 2008: Santa Clara, California, USA

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  Douglas Young, Nur A. Touba (Eds.): 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. IEEE 2008 ISBN 978-1-4244-2403-0 [ contents ]

ITC 2007: Santa Clara, California, USA

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  Jill Sibert, Janusz Rajski (Eds.): 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. IEEE 2007 ISBN 1-4244-1128-9 [ contents ]

ITC 2006: Santa Clara, California, USA

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  Scott Davidson, Anne Gattiker (Eds.): 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE 2006 ISBN 1-4244-0292-1 [ contents ]

ITC 2005: Austin, TX, USA

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  Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. IEEE 2005 ISBN 0-7803-9038-5 [ contents ]

ITC 2004: Charlotte, NC, USA

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  Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. IEEE 2003 ISBN 0-7803-8581-0 [ contents ]

ITC 2003: Charlotte, NC, USA

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  Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. IEEE Computer Society 2003 ISBN 0-7803-8106-8 [ contents ]

ITC 2002: Baltimore, MD, USA

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  Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. IEEE Computer Society 2002 [ contents ]

ITC 2001: Baltimore, MD, USA

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  Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. IEEE Computer Society 2001 ISBN 0-7803-7169-0 [ contents ]

ITC 2000: Atlantic City, NJ, USA

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  Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. IEEE Computer Society 2000 [ contents ]

ITC 1999: Atlantic City, NJ, USA

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  Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. IEEE Computer Society 1999 [ contents ]

ITC 1998: Washington, DC, USA

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  Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. IEEE Computer Society 1998 ISBN 0-7803-5093-6 [ contents ]

ITC 1997: Washington, DC, USA

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  Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. IEEE Computer Society 1997 ISBN 0-7803-4209-7 [ contents ]

ITC 1996: Washington, DC, USA

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  Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. IEEE Computer Society 1996 ISBN 0-7803-3541-4 [ contents ]

ITC 1995: Washington, DC, USA

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  Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. IEEE Computer Society 1995 ISBN 0-7803-2992-9 [ contents ]

ITC 1994: Washington, DC, USA

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  Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. IEEE Computer Society 1994 ISBN 0-7803-2103-0 [ contents ]

ITC 1993: Baltimore, MD, USA

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  Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. IEEE Computer Society 1993 ISBN 0-7803-1430-1 [ contents ]

ITC 1992: Baltimore, MD, USA

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  Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. IEEE Computer Society 1992 ISBN 0-7803-0760-7 [ contents ]

ITC 1991: Nashville, TN, USA

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  Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. IEEE Computer Society 1991 ISBN 0-8186-9156-5 [ contents ]

ITC 1990: Washington, DC, USA

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  Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. IEEE Computer Society 1990 ISBN 0-8186-9064- [ contents ]

ITC 1989: Washington, D.C., USA

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  Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. IEEE Computer Society 1989 [ contents ]

ITC 1988: Washington, D.C., USA

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  Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. IEEE Computer Society 1988 [ contents ]

ITC 1986: Washington, D.C., USA

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  Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. IEEE Computer Society 1986 [ contents ]

ITC 1985: Philadelphia, PA, USA

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  Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. IEEE Computer Society 1985 [ contents ]

ITC 1984: Philadelphia, PA, USA

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  Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. IEEE Computer Society 1984 [ contents ]

ITC 1983: Philadelphia, PA, USA

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  Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. IEEE Computer Society 1983 [ contents ]

ITC 1982: Philadelphia, PA, USA

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  Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. IEEE Computer Society 1982 [ contents ]

ITC 1981: Philadelphia, PA, USA

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  Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. IEEE Computer Society 1981 [ contents ]