ISSTA 2011: Toronto, ON, Canada

Matthew B. Dwyer, Frank Tip (Eds.): Proceedings of the 20th International Symposium on Software Testing and Analysis, ISSTA 2011, Toronto, ON, Canada, July 17-21, 2011. ACM 2011, ISBN 978-1-4503-0562-4

Test generation I

Kunal Taneja, Tao Xie, Nikolai Tillmann, Jonathan de Halleux:
eXpress: guided path exploration for efficient regression test generation. 1-11
Domagoj Babic, Lorenzo Martignoni, Stephen McCamant, Dawn Song:
Statically-directed dynamic automated test generation. 12-22
Patrice Godefroid, Daniel Luchaup:
Automatic partial loop summarization in dynamic test generation. 23-33
Corina S. Pasareanu, Neha Rungta, Willem Visser:
Symbolic execution with mixed concrete-symbolic solving. 34-44

Models

Daniel Balasubramanian, Corina S. Pasareanu, Michael W. Whalen, Gabor Karsai, Michael R. Lowry:
Polyglot: modeling and analysis for multiple Statechart formalisms. 45-55
Matthew J. McGill, Laura K. Dillon, R. E. Kurt Stirewalt:
Scalable analysis of conceptual data models. 56-66
Jaideep Nijjar, Tevfik Bultan:
Bounded verification of Ruby on Rails data models. 67-77
Ayesha Yasmeen, Elsa L. Gunter:
Automated framework for formal operator task analysis. 78-88

Analysis of systems and binary code

Andrew R. Bernat, Kevin A. Roundy, Barton P. Miller:
Efficient, sensitivity resistant binary instrumentation. 89-99
Nathan E. Rosenblum, Barton P. Miller, Xiaojin Zhu:
Recovering the toolchain provenance of binary code. 100-110
Cindy Rubio-González, Ben Liblit:
Defective error/pointer interactions in the Linux kernel. 111-121

Concurrency

Jacob Burnim, Koushik Sen, Christos Stergiou:
Testing concurrent programs on relaxed memory models. 122-132
Vilas Jagannath, Qingzhou Luo, Darko Marinov:
Change-aware preemption prioritization. 133-143
Jeff Huang, Charles Zhang:
Persuasive prediction of concurrency access anomalies. 144-154

Program analysis

Dacong Yan, Guoqing (Harry) Xu, Atanas Rountev:
Demand-driven context-sensitive alias analysis for Java. 155-165
Takaaki Tateishi, Marco Pistoia, Omer Tripp:
Path- and index-sensitive string analysis based on monadic second-order logic. 166-176
Salvatore Guarnieri, Marco Pistoia, Omer Tripp, Julian Dolby, Stephen Teilhet, Ryan Berg:
Saving the world wide web from vulnerable JavaScript. 177-187
Xiao Xiao, Charles Zhang:
Geometric encoding: forging the high performance context sensitive points-to analysis for Java. 188-198

Faults I

Chris Parnin, Alessandro Orso:
Are automated debugging techniques actually helping programmers? 199-209
Nicholas DiGiuseppe, James A. Jones:
On the influence of multiple faults on coverage-based fault localization. 210-220
Martin Burger, Andreas Zeller:
Minimizing reproduction of software failures. 221-231
Michael Pradel, Thomas R. Gross:
Detecting anomalies in the order of equally-typed method arguments. 232-242

Combinatorial and random testing

Emine Dumlu, Cemal Yilmaz, Myra B. Cohen, Adam A. Porter:
Feedback driven adaptive combinatorial testing. 243-253
Itai Segall, Rachel Tzoref-Brill, Eitan Farchi:
Using binary decision diagrams for combinatorial test design. 254-264
Andrea Arcuri, Lionel C. Briand:
Adaptive random testing: an illusion of effectiveness? 265-275

Specification and optimization

Muzammil Shahbaz, K. C. Shashidhar, Robert Eschbach:
Iterative refinement of specification for component based embedded systems. 276-286
Philip J. Guo, Dawson R. Engler:
Using automatic persistent memoization to facilitate data analysis scripting. 287-297
Milos Gligoric, Darko Marinov, Sam Kamin:
CoDeSe: fast deserialization via code generation. 298-308

Faults II

William N. Sumner, Tao Bao, Xiangyu Zhang:
Selecting peers for execution comparison. 309-319
Wei Le, Mary Lou Soffa:
Generating analyses for detecting faults in path segments. 320-330
Zhiqiang Zhang, Jian Zhang:
Characterizing failure-causing parameter interactions by adaptive testing. 331-341
Akbar Siami Namin, Sahitya Kakarla:
The use of mutation in testing experiments and its sensitivity to external threats. 342-352

Test generation II

Sai Zhang, David Saff, Yingyi Bu, Michael D. Ernst:
Combined static and dynamic automated test generation. 353-363
Gordon Fraser, Andreas Zeller:
Generating parameterized unit tests. 364-374
Tristan O. R. Allwood, Cristian Cadar, Susan Eisenbach:
High coverage testing of Haskell programs. 375-385

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