21. ISSRE 2010: San Jose, CA, USA

IEEE 21st International Symposium on Software Reliability Engineering, ISSRE 2010, San Jose, CA, USA, 1-4 November 2010. IEEE Computer Society 2010 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML

Predicting Defects

Reliability Modeling 1

Empirical Studies 1

Security 1

Testing 1

Validation 1

Testing 2

Reliability Modeling 2

Empirical Studies 2

Practical Experience Reports

Empirical Studies 3

Security 2

Testing 3

Validation 2