International Symposium on Quality Electronic Design, ISQED 2002, 18-21 March 2002, San Jose, California, USA. IEEE Computer Society, 2002, online publication:
San Jose, California, USA
Test Methodologies for Quality Designs
: Design-for-Test Techniques for SoC Designs (Tutorial Abstract).
Design for Reliability in UDSM:
Issues and Solutions
: Issues in Deep Submicron State-of-the-Art ESD Design (Tutorial Abstract).
J. Joseph Clement
: Electromigration Reliability Issues in High-Performance Circuit Design (Tutorial Abstract).
John S. Suehle
: Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract).
: Hot Carrier Reliability and Design Considerations (Tutorial Abstract).
Interconnect and Device Modeling for Quality Design
: Power/Ground Integrity Issues for Sub-130nm IC Designs (Tutorial Abstract).
: A General and Comparative Study of RC(0), RC, RCL and RCLK Modeling of Interconnects and Their Impact on the Design of Multi-Giga Hertz Processors (Tutorial Abstract).
: MOS Modeling, Design Quality, and Modern Analog Design (Tutorial Abstract).
: RLCK Extraction and Simulation in High-Speed SoC Designs (Tutorial Abstract).
Design Flows and Methodologies
: nVHDL: A Hardware Design Language for Modeling Discrete and Analog Design and Simulation of Mixed-Signal Electronic Systems (Tutorial Abstract).
: Platform-Based Design: A Tutorial (Tutorial Abstract).
: Quality Aspects of SOI Circuit Design (Tutorial Abstract).
: Optimization in an Integrated Physical Design Flow (Tutorial Abstract).
Plenary Session I
: IP REUSE QUALITY: "Intellectual Property" or "Intense Pain"?
: Why Integrated Yield Management is a Necessity.
: Design Success: Foundry Perspective.
Y. C. Pati
: What You Don't Know CAN Hurt You: Designing for Survival in a Sub-wavelength Environment.
Interconnect Extraction and Modeling
Quality and Interoperability of EDA Tools
: Using the Open Library Architecture (OLA) Open Source API in Heterogeneous Design Flows (invited).
, Rick Ferreri
, Jim Wilmore
: The OpenAccess Coalition - The Drive to an Open Industry Standard Information Model, API, and Reference Implementation for IC Design Data (invited).
Design for Test
Design for Process Variations
Power, Signal and EMI Analysis and Optimization
, Ibrahim N. Hajj
: Simultaneous Switching Noise and Resonance Analysis of On-Chip Power Distribution Network.
Abby A. Ilumoka
: Chip Level Signal Integrity Analysis & Crosstalk Prediction Using Artificial Neural Nets.
Methods and Metrics for Design Quality
Daniel N. Maynard
: Productivity Optimization Techniques for the Proactive Semiconductor Manufacturer (invited).
Plenary Session II
: The Role of ICs in the Creation of a Connected World and the Importance of Product Quality.
: Microwave III-V Semiconductors for Telecommunications and Prospective of the III-V Industry.
: Tomorrows High-Quality SoCs Require High-Quality Embedded Memories Today.
, Tom Chen
: Improving the Efficiency and Quality of Simulation-Based Behavioral Model Verification Using Dynamic Bayesian Criteria.
: In Search of the Origin of VHDL's Delta Delays.
Design Issues for Power and Noise Management
Peter A. Beerel
: Asynchronous Circuits: An Increasingly Practical Design Solution (invited).
Verification in Achieving Design Quality
Low Power Design Techniques
: Low-Power and High-Speed V VLSI Design with Low Supply Voltage through Cooperation between Levels (invited).
, Diana Marculescu
: Does Q=MC2? (On the Relationship between Quality in Electronic Design and the Model of Colloidal Computing, invited).
Geun Rae Cho
, Tom Chen
: Mixed PTL/Static Logic Synthesis Using Genetic Algorithms for Low-Power Applications.
Advanced Device Technology Issues in Circuit Design
: Single-Electronics - How It Works. How It's Used. How It's Simulated (invited).
Design, Planning and Closure