17. IOLTS 2011:
Athens, Greece 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece.
IEEE 2011, ISBN 978-1-4577-1053-7
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Rance Rodrigues ,
Sandip Kundu :
On graceful degradation of chip multiprocessors in presence of faults via flexible pooling of critical execution units.
67-72
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conf/iolts/GrigoryanHSVZ11
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conf/iolts/AymerichABCCFGHMMPRRVVWZ11 Nivard Aymerich ,
A. Asenov ,
A. Brown ,
Ramon Canal ,
B. Cheng ,
Joan Figueras ,
Antonio González ,
Enric Herrero ,
S. Markov ,
Miguel Miranda ,
Peyman Pouyan ,
Tanausú Ramírez ,
Antonio Rubio ,
I. Vatajelu ,
Xavier Vera ,
X. Wang ,
Paul Zuber :
New reliability mechanisms in memory design for sub-22nm technologies.
111-114
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Paolo Maistri :
Countermeasures against fault attacks: The good, the bad, and the ugly.
134-137
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conf/iolts/ShiyanovskiiRP11
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conf/iolts/RajendranSWP11
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conf/iolts/YoshimotoAKTYMYKY11
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conf/iolts/Alexandrescu11 Dan Alexandrescu :
A comprehensive soft error analysis methodology for SoCs/ASICs memory instances.
175-176
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conf/iolts/SauerTMLSPBB11
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Mikhail Baklashov :
An on-line memory state validation using shadow memory cloning.
186-189
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Eberhard Böhl ,
Paul Duplys :
Fault attack resistant deterministic random bit generator usable for key randomization.
194-195
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Zhen Wang ,
Mark G. Karpovsky :
Algebraic manipulation detection codes and their applications for design of secure cryptographic devices.
234-239
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conf/iolts/AbellaCQGYBGMB11
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