9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece.
IEEE Computer Society 2003, ISBN 0-7695-1968-7
9. IOLTS 2003:
Kos Island, Greece
: Challenges and Opportunities for FPGA Programmable System Platforms.
: Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices.
On-Line Testing Approaches
Self Checking Circuits
How Can Defect-Based Test Be Made to Work in a Foundry World?
Analysis and Modelling of Transient and Delay Faults
Analysis and Verification of FPGA Faults
On-Line Testing of Microprocessor-Based Systems
: Evaluation of the Quality of Testing Path Delay Faults under Restricted Input Assumption.
Merging On-Line and Off-Line Testing
When Will Soft Errors Become A Design Constraint?
Advanced Testing and Repair Issues