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IEEE VAST 2009: Atlantic City, New Jersey, USA

Proceedings of the IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2009, Atlantic City, New Jersey, USA, 11-16 October 2009, part of VisWeek 2009. IEEE 2009 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML

Keynote

Spatio-Temporal Analytics

Multidimensional Data

Text Analytics

Analysis Process & Graph Analytics

Life Science & Financial Applications

Best Paper

Posters

Challenge

Panel

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