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IEEE VAST 2008: Columbus, Ohio, USA

Proceedings of the IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, Ohio, USA, 19-24 October 2008. IEEE 2008 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML

Keynote

Scientific Visual Analytics and Learning

Temporal and Spatial Visual Analytics

Collaboration and Evaluation

Best Paper Award

Reasoning, Insight, and System Aspects

Multidimensional Data Visual Analytics

Posters

Challenge

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