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International Conference on Control and Automation (ICCA)
18th ICCA 2024: Reykjavik, Iceland
- 18th IEEE International Conference on Control & Automation, ICCA 2024, Reykjavík, Iceland, June 18-21, 2024. IEEE 2024, ISBN 979-8-3503-5440-9 [contents]
17th ICCA 2022: Naples, Italy
- 17th IEEE International Conference on Control & Automation, ICCA 2022, Naples, Italy, June 27-30, 2022. IEEE 2022, ISBN 978-1-6654-9572-1 [contents]
16th ICCA 2020: Hybrid Event / Singapore
- 16th IEEE International Conference on Control & Automation, ICCA 2020, Singapore, October 9-11, 2020. IEEE 2020, ISBN 978-1-7281-9093-8 [contents]
15th ICCA 2019: Edinburgh, UK
- 15th IEEE International Conference on Control and Automation, ICCA 2019, Edinburgh, United Kingdom, July 16-19, 2019. IEEE 2019, ISBN 978-1-7281-1164-3 [contents]
14th ICCA 2018: Anchorage, AK, USA
- 14th IEEE International Conference on Control and Automation, ICCA 2018, Anchorage, AK, USA, June 12-15, 2018. IEEE 2018, ISBN 978-1-5386-6089-8 [contents]
13th ICCA 2017: Ohrid, Macedonia
- 13th IEEE International Conference on Control & Automation, ICCA 2017, Ohrid, Macedonia, July 3-6, 2017. IEEE 2017, ISBN 978-1-5386-2679-5 [contents]
12th ICCA 2016: Kathmandu, Nepal
- 12th IEEE International Conference on Control and Automation, ICCA 2016, Kathmandu, Nepal, June 1-3, 2016. IEEE 2016, ISBN 978-1-5090-1738-6 [contents]
11th ICCA 2014: Taichung, Taiwan
- 11th IEEE International Conference on Control & Automation, ICCA 2014, Taichung, Taiwan, June 18-20, 2014. IEEE 2014, ISBN 978-1-4799-2837-8 [contents]
10th ICCA 2013: Hangzhou, China
- 10th IEEE International Conference on Control and Automation, ICCA 2013, Hangzhou, China, June 12-14, 2013. IEEE 2013, ISBN 978-1-4673-4707-5 [contents]
9th ICCA 2011: Santiago, Chile
- 9th IEEE International Conference on Control and Automation, ICCA 2011, Santiago, Chile, December 19-21, 2011. IEEE 2011, ISBN 978-1-4577-1475-7 [contents]
8th ICCA 2010: Xiamen, China
- 8th IEEE International Conference on Control and Automation, ICCA 2010, Xiamen, China, June 9-11, 2010. IEEE 2010, ISBN 978-1-4244-5195-1 [contents]
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