Low-level processing, vectorization and segmentation

• 
  Lawrence O'Gorman: Basic Techniques and Symbol-Level Recognition - An Overview. 1-12
• 
  Luigi P. Cordella, Angelo Marcelli: An Alternative Approach to the Performance Evaluation of Thinning Algorithms for Document Processing Applications. 13-22
• 
  Tokuhisa Kadonaga, Keiichi Abe: Comparison of Methods for Detecting Corner Points from Digital Curves. 23-34
• 
  Atul K. Chhabra, Vishal Misra, Juan F. Arias: Detection of Horizontal Lines in Noisy Run Length Encoded Images: The FAST Method. 35-48
• 
  Markus Röösli, Gladys Monagan: Adding Geometric Constraints to the Vectorization of Line Drawings. 49-56
• 
  Osamu Hori, David S. Doermann: Quantitative Measurement of the Performance of Raster-to-Vector Conversion Algorithms. 57-68
• 
  E. Turolla, Yolande Belaïd, Abdel Belaïd: Form Item Extraction Based on Line Searching. 69-79
• 
  Edward A. Green, Mukkai S. Krishnamoorthy: Model-Based Analysis of Printed Tables. 80-91
• 
  Gady Agam, Huizhu Luo, Its'hak Dinstein: Morphological Approach for Dashed Lines Detection. 92-105

Symbol and diagram recognition

• 
  Dorothea Blostein: General Diagram-Recognition Methodologies. 106-122
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  Bruno T. Messmer, Horst Bunke: Automatic Learning and Recognition of Graphical Symbols in Engineering Drawings. 123-134
• 
  Francesca Cesarini, Marco Gori, Simone Marinai, Giovanni Soda: A Hybrid System for Locating and Recognizing Low Level Graphic Items. 135-147
• 
  Joe R. McDaniel, Jason R. Balmuth: Automatic Interpretation of Chemical Structure Diagrams. 148-158

Map processing

• 
  Jurgen den Hartog, Ton K. ten Kate, Jan J. Gerbrands: Knowledge-Based Segmentation for Automatic Map Interpretation. 159-178
• 
  Min-Ki Kim, Mun-Kyu Park, Oh-Sung Kwon, Young-Bin Kwon: Automatic Region Labeling of the Layered Map. 179-189
• 
  Gregory K. Myers, Prasanna G. Mulgaonkar, Chien-Huei Chen, Jeff L. DeCurtins, Edward Chen: Verification-Based Approach for Automated Text and Feature Extraction from Raster-Scanned Maps. 190-203
• 
  Arnold W. M. Smeulders, Ton K. ten Kate: Software System Design for Paper Map Conversion. 204-211

Engineering drawings

• 
  Dov Dori, Yelena Velkovitch, Liu Wenyin: Object-Process Based Segmentation and Recognition of ANSI and ISO Standard Dimensioning Texts. 212-232
• 
  Peter D. Thomas, Janet F. Poliakoff, Sabah M. Razzaq, Robert J. Whitrow: A Combined High and Low Level Approach to Interpreting Scanned Engineering Drawings. 233-245
• 
  María A. Capellades, Octavia I. Camps: Functional Parts Detection in Engineering Drawings: Looking for the Screws. 246-259
• 
  Ken Tomiyama, Ken'ichi Nakaniwa: Reconstruction of 3D Solid Model from Three Orthographic Views - Top-Down Approach. 260-269

Dashed-line detection contest

• 
  Bin Kong, Ihsin T. Phillips, Robert M. Haralick, Arathi Prasad, Rangachar Kasturi: A Benchmark: Performance Evaluation of Dashed-Line Detection Algorithms. 270-285
• 
  Dov Dori, Liu Wenyin, Mor Peleg: How to Win a Dashed Line Detection Contest. 286-300
• 
  Rangachar Kasturi, Karl Tombre: Summary and Recommendations. 301-308

last updated on Mon May 20 02:01:53 2013 by the dblp team
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