19. FTCS 1989: Chicago, IL, USA

• Michael J. Iacoponi, David K. Vail:
  The fault tolerance approach of the Advanced Architecture Onboard Processor. 6-12
  
• Nobuyasu Kanekawa, Hideo Maejima, Hatsuhiko Kato, Hirokazu Ihara:
  Dependable onboard computer systems with a new method-stepwise negotiating voting. 13-19
  
• Richard Harper, Gail Nagle, Martin A. Serrano:
  Use of a functional programming model in fault tolerant parallel processing. 20-26
  
• Kwang-Ting Cheng, Vishwani D. Agrawal:
  An economical scan design for sequential logic test generation. 28-35
  
• Manoj Franklin, Kewal K. Saluja, Kozo Kinoshita:
  Row/column pattern sensitive fault detection in RAMs via built-in self-test. 36-43
  
• Michael H. Schulz, Karl Fuchs, Franz Fink:
  Advanced automatic test pattern generation techniques for path delay faults. 44-51
  
• Abhijit Sengupta, Anton T. Dahbura:
  On self-diagnosable multiprocessor systems: diagnosis by the comparison approach. 54-61
  
• Douglas M. Blough, Gregory F. Sullivan, Gerald M. Masson:
  Fault diagnosis for sparsely interconnected multiprocessor systems. 62-69
  
• Arun K. Somani, Vinod K. Agarwal:
  Distributed syndrome decoding for regular interconnected structures. 70-77
  
• Leonard M. Napolitano Jr., David D. Andaleon, K. R. Berry, P. R. Bryson, S. R. Klapp, J. E. Leeper, G. Robert Redinbo:
  Fault-tolerance in a high-speed 2D convolver/correlator: Starloc. 80-87
  
• John A. Trotter, Will R. Moore:
  Imperfectly connected 2D arrays for image processing. 88-92
  
• Onat Menzilcioglu, H. T. Kung, Siang Wun Song:
  Comprehensive evaluation of a two-dimensional configurable array. 93-100
  
• Srinivas Devadas, Hi-Keung Tony Ma, A. Richard Newton:
  Easily testable PLA-based finite state machines. 102-109
  
• Hans-Joachim Wunderlich:
  The design of random-testable sequential circuits. 110-117
  
• Rajesh Gupta, Melvin A. Breuer:
  BALLAST: a methodology for partial scan design. 118-125
  
• Nagesh Vasanthavada, Philip Thambidurai, Peter N. Marinos:
  Design of fault-tolerant clocks with realistic failure assumptions. 128-133
  
• Tomohiro Yoneda, Kazutoshi Nakade, Yoshihiro Tohma:
  A fast timing verification method based on the independence of units. 134-141
  
• Philip M. Thambidurai, Alan M. Finn, Roger M. Kieckhafer, Chris J. Walter:
  Clock synchronization in MAFT. 142-149
  
• Robert Geist, Mark Smotherman, Michael Brown:
  Ultrahigh reliability estimates for systems exhibiting globally time-dependent failure processes. 152-158
  
• B. E. Aupperle, John F. Meyer, Lu Wei:
  Evaluation of fault-tolerant systems with nonhomogeneous workloads. 159-166
  
• Yuan-Bao Shieh, Dipak Ghosal, Satish K. Tripathi:
  Modeling of fault-tolerant techniques in hierarchical systems. 167-174
  
• John F. Meyer, K. H. Muralidhar, William H. Sanders:
  Performability of a token bus network under transient fault conditions. 175-182
  
• Neil A. Speirs, Peter A. Barrett:
  Using passive replicates in Delta-4 to provide dependable distributed computing. 184-190
  
• Klaus Echtle:
  Distance agreement protocols. 191-198
  
• Andrew Xu, Barbara Liskov:
  A design for a fault-tolerant, distributed implementation of Linda. 199-206
  
• Jehoshua Bruck, Mario Blaum:
  Some new EC/AUED codes. 208-215
  
• Larry A. Dunning, Gur Dial, Murali R. Varanasi:
  Unidirectional 9-bit byte error detecting codes for computer memory systems. 216-221
  
• Bella Bose:
  Byte unidirectional error correcting codes. 222-228
  
• Sulaiman Al-Bassam, Bella Bose:
  Design of efficient balanced codes. 229-236
  
• Ytzhak H. Levendel:
  Defects and reliability analysis of large software systems: field experience. 238-244
  
• Takahiko Yamada, Satoshi Ogawa:
  Fault tolerant multiprocessor for digital switching systems. 245-252
  
• Michele Morganti:
  F-T in telecommunications networks: state, perspectives, trends. 253-258
  
• Robert W. Horst:
  Reliable design of high-speed cache and control store memories. 259-266
  
• James M. Purtilo, Pankaj Jalote:
  A system for supporting multi-language versions for software fault tolerance. 268-274
  
• A. Ravichandran, Krishna Kant:
  Fault identification in robust data structures. 275-282
  
• Jean-Chrysostome Bolot, Pankaj Jalote:
  Formal verification of programs with exceptions. 283-290
  
• Jon G. Jr. Udell, Edward J. McCluskey:
  Pseudo-exhaustive test and segmentation: formal definitions and extended fault coverage results. 292-298
  
• Bernd Becker, Uwe Sparmann:
  Computations over finite monoids and their test complexity. 299-306
  
• Mireille Jacomino, Rene David:
  A new approach of test confidence estimation. 307-314
  
• Shamsul Chowdhury:
  Estimation of maximum currents for fault tolerant design of power distribution systems in integrated circuits. 316-322
  
• Siu-Cheung Chau, Arthur L. Liestman:
  A proposal for a fault-tolerant binary hypercube architecture. 323-330
  
• Alan Olson, Kang G. Shin:
  Message routing in HARTS with faulty components. 331-338
  
• Ulf Gunneflo, Johan Karlsson, Jan Torin:
  Evaluation of error detection schemes using fault injection by heavy-ion radiation. 340-347
  
• Jean Arlat, Yves Crouzet, Jean-Claude Laprie:
  Fault injection for dependability validation of fault-tolerant computing systems. 348-355
  
• Ram Chillarege, Nicholas S. Bowen:
  Understanding large system failures-a fault injection experiment. 356-363
  
• Shri Balaji, Lawrence Jenkins, Lalit M. Patnaik, Prem Shankar Goel:
  Workload redistribution for fault-tolerance in a hard real-time distributed computing system. 366-373
  
• C. Mani Krishna, Adit D. Singh:
  Modelling correlated transient failures in fault-tolerant systems. 374-381
  
• M. J. Iacoponi:
  Optimal control of latent fault accumulation. 382-388
  
• Takashi Nanya, Masatoshi Uchida:
  A strongly fault-secure and strongly code-disjoint realization of combinational circuits. 390-397
  
• Michael Nicolaidis, S. Noraz, Bernard Courtois:
  A generalized theory of fail-safe systems. 398-406
  
• Niraj K. Jha:
  Fault detection in CVS parity trees: application in SSC CVS parity and two-rail checkers. 407-414
  
• Nirmal R. Saxena, Edward J. McCluskey:
  Control-flow checking using watchdog assists and extended-precision checksums. 428-435
  
• Gurindar S. Sohi, Manoj Franklin, Kewal K. Saluja:
  A study of time-redundant fault tolerance techniques for high-performance pipelined computers. 436-443
  
• Paul R. Lorczak, Alper K. Caglayan, Dave E. Eckhardt:
  A theoretical investigation of generalized voters for redundant systems. 444-451
  
• Luigi Vincenzo Mancini, Santosh K. Shrivastava:
  Replication within atomic actions and conversations: a case study in fault-tolerance duality. 454-461
  
• Ahmed Gheith, Karsten Schwan:
  CHAOS^art: support for real-time atomic transactions. 462-469
  
• Susan B. Davidson, Insup Lee, Victor Fay Wolfe:
  Language constructs for timed atomic commitment. 470-477
  
• Pinaki Mazumder, Jih-Shyr Yih:
  Neural computing for built-in self-repair of embedded memory arrays. 480-487
  
• Rami G. Melhem:
  Bi-level reconfigurations of fault tolerant arrays in bi-modal computational environments. 488-495
  
• Shantanu Dutt, John P. Hayes:
  An automorphic approach to the design of fault-tolerant multiprocessors. 496-503
  
• Samuel T. Gregory, John C. Knight:
  On the provision of backward error recovery in production programming languages. 506-511
  
• Stuart J. Adams:
  Hardware assisted recovery from transient errors in redundant processing systems. 512-519
  
• Kun-Lung Wu, W. Kent Fuchs:
  Recoverable distributed shared virtual memory: memory coherence and storage structures. 520-527
  
• Chita R. Das, Jong Kim:
  An analytical model for computing hypercube availability. 530-537
  
• Vikram V. Karmarkar, Jon G. Kuhl:
  Fail-softness evaluation in multiple-bus local computer networks. 538-544
  
• Noé Lopez-Benitez, José A. B. Fortes:
  Detailed modeling of fault-tolerant processor arrays. 545-552
  
• Shi-ze Huang, Jie Xu, Tinghuai Chen:
  Characterization and design of sequentially t-diagnosable systems. 554-559
  
• Donald S. Fussell, Sampath Rangarajan:
  Probabilistic diagnosis of multiprocessor systems with arbitrary connectivity. 560-565
  
• Arun K. Somani, Tushar R. Sarnaik:
  Reliability analysis and comparison of two fail-op/fail-op/fail-safe architectures. 566-573
  

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