Tarun Kumar Goyal, Amarpal Singh, Rahul Aggarwal: Efficient selective compaction and un-compaction of inconsequential logical design units in the schematic representation of a design.
106-112
N. L. Dudar, V. M. Borzdov: Device-process simulation of discrete silicon stabilitron with the stabilizing voltage of 6, 5 V.
237-239
V. A. Tverdokhlebov: Geometrical approach to technical diagnosing of automatons.
240-243
Vasily Kulikov, Vladimir Mokhor: On experimental research of efficiency of tests construction for combinational circuits by the focused search method.
247-250
Valentina Andreeva: Test set compaction procedure for combinational circuits based on decomposition tree.
251-254
N. Butorina, S. Ostanin: Implementation by the special formula of an arbitrary subset of code words of (m, n)-code for designing a self-testing checker.
255-258
H. J. Kadim: Optimal fluctuations for satisfactory performance under parameter uncertainty.
259-263
Konorev Borys, Sergiyenko Volodymyr, Chertkov Georgiy: The evidential independent verification of software of information and control systems, critical to safety: Functional model of scenario.
263-266
D. A. Velychko, I. I. Vdovychenko: A calculation of parasitic signal components digital filtration for the retransmission meter on the basis of FPGA.
335-336