15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic.
IEEE Computer Society 2010, ISBN 978-1-4244-5833-2
Prague, Czech Republic
: Plenary presentations: Keynote: The product complexity and test - How product complexity impacts test industry.
: Invited talk: Self-aware wireless communication and signal processing systems: Real-time adaptation for error resilience, low power and performance.
3D and Multi-Core Test
Post-Silicon Debug and Diagnosis
Ho Fai Ko
, Nicola Nicolici
: Combining scan and trace buffers for enhancing real-time observability in post-silicon debugging.
Fault Detection, Tolerance and Identification
Advanced Test Infrastructure
Resistive Bridges and Opens
Advanced ADC Testing
Design Validation, Test and Debug of Complex Systems
Innovative Techniques for Highly Reliable Microprocessor-Based Systems
Fault Tolerance and Online Testing