ETS 2009: Sevilla, Spain

Plenary Presentations

Internal Testing of Mixed-Signal Cores

Debug and Validation

Power Issues during Test

Selt-Test and Test Throughput

On-Line Testing

Advanced Testing of Memories, Power Transistors and Microfluidic Systems

Recent Advances in ATPG

Advanced External Testing of Mixed-Signals Cores

Diagnosis and Dependability Analysis

Impact of Nanometer Technologies in the Testing Methodology

DfT and Embedded Test

ETS'08 Best Paper

maintained by Schloss Dagstuhl LZI at University of Trier