3. DELTA 2006: Kuala Lumpur, Malaysia
Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia. IEEE Computer Society 2006 ISBN 0-7695-2500-8
Cover
Title Page.
Copyright.
Introduction
Message from the General Chairs.
Message from the Program Chairs.
Committees.
Reviewers.
Session 1A: Special Session on Diagnostic in Deep Submicron Technologies
Talal Arnaout, Gunter Bartsch, Hans-Joachim Wunderlich: Some Common Aspects of Design Validation, Debug and Diagnosis. 3-10
Session 1B: Analog Components and Design Techniques
Josef Goette, Marcel Jacomet, Markus Hager: Using Dither to Improve the Performance of Lossy Sigma-Delta Modulators. 11-16
Woochul Jeon, John Melngailis, Robert W. Newcomb: CMOS Schottky diode microwave power detector fabrication, Spice modeling, and applications. 17-22
Amlan Ghosh, Abhishek Ranjan, Nirmal B. Chakrabarti: Design and Implementation of Analog Multitone Signal Generator Using Regenerative Frequency Divider for OFDM Transceiver. 23-30
Session 2A: Image and Video Processing
Xu Huang, Allan C. Madoc, Dharmendra Sharma: Image Noise Removal in Nakagami Fading Channels via Bayesian Estimator. 31-34
Hui Fang, Puteri Norhashimah, Jianmin Jiang, Yong Yin: A Hybrid Scheme for Temporal Video Segmentation. 35-40
Melanie Po-Leen Ooi: Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space. 41-46
K. T. Gribbon, Donald G. Bailey, Christopher T. Johnston: Using Design Patterns to Overcome Image Processing Constraints on FPGAs. 47-56
Session 2B: Special Session on Industrial and Practical Test Engineering
Zhuoyu Bao, Suriya A. Kumar, David M. Wu, Vimal K. Natarajan, Mike Lin: A Low Cost, High Quality Embedded Array DFT Technique for High Performance Processors. 57-63
Chuah Joon Huang Huang, Joel Knight: VertiCal, a Universal Calibration System for eSys High Performance 32-Bit PowerPC Microcontrollers; Test Challenges & Solution. 64-67
Shao Chee Ong: Enabling Test-Time Optimized Pseudorandom Bit Stream (PRBS) 2^31 BER Testing on Automated Test Equipment for 10Gbps Device. 68-73
Lew Boon Kian: Test Cost Saving and Challenges in the Implementation of x6 and x8 Parallel Testing on Freescale 16-bit HCS12 Micro-controller Product Family. 74-82
Poster Session 1
Kan-Lin Hsiung: Design of High-Speed Metal-Semiconductor-Metal Photodetectors: An Optimization-Based Approach. 83-84
Johnny Koh, Tiong Sieh Kiong, I. B. Aris, Senan Mahmoud: Dual-Head Marking Performance Optimisation via Evolutionary Solutions. 85-88
Peter J. Green, Desmond P. Taylor: Implementation of Four Real-Time Software Defined Receivers and a Space-Time Decoder using Xilinx Virtex 2 Pro Field Programmable Gate Array. 89-92
Leipo Yan, Siew Kei Lam, Thambipillai Srikanthan, Wu Jigang: Energy Efficient Cache Tuning with Performance Bound. 97-100
Moi-Tin Chew, Gourab Sen Gupta, Subhas Mukhopadhyay, Tracey Kah-Mein Lee: Developing an Effective Microcontroller Course Based on Field-Programmable Mixed-Signal µ-Controller Product. 101-104
Syed Zahidul Islam, Mohd. Alauddin Mohd. Ali: Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique. 105-112
Session 3A: Special Session on Electronics Education
Ton J. Mouthaan, Anke Kohl: Internationalisation of Masters education; globalisation at work. 113-115
Serge N. Demidenko, Victor Lai: Industry-Academia Collaboration in Undergraduate Test Engineering Unit Development. 116-122
Gourab Sen Gupta, Subhas Mukhopadhyay, Moi-Tin Chew: A Project Based Approach to Teach Mixed-Signal Embedded Microcontroller for DC Motor Control. 123-128
Session 3B: Synthesis and Logic Optimization
Takashi Hirayama, Yasuaki Nishitani: Efficient Search Methods for Obtaining Exact Minimum AND-EXOR Expressions. 137-142
Achim Rettberg, Franz J. Rammig: A new Design Partitioning Approach for Low Power High-Level Synthesis. 143-148
Jia Di, Dilip P. Vasudevan: Synthesis of Nanoelectronic Circuits on Delay-Insensitive Cellular Arrays. 149-156
Session 4A: Special Session on Electromagnetic Sensors & Devices 1
T. Somsak, K. Chomsuwan, S. Yamada, M. Iwahara, S. C. Mukhopadhyay: Conductive Microbead Detection by Helmholtz Coil Technique With SV-GMR Sensor. 157-162
James Mazierska, J. Krupka, Marek E. Bialkowski, Mohan V. Jacob: Microwave Resonators and Their use as a Measurement Intruments and Sensors. 163-167
Session 4B: Fault Modelling
Hans G. Kerkhoff, Xiao Zhang, R. W. Barber, D. R. Emerson: Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. 177-182
Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell: Electrical Behavior of GOS Fault affected Domino Logic Cell. 183-189
Muhsen Aljada, Adam Osseiran, Kamal Alameh: Catastrophic and Parametric Fault Modelling for Photonic Systems. 190-196
Poster Session 2
Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura: Current Testable Design of Resistor String DACs. 197-200
Min-An Song, Ting-Chun Huang, Sy-Yen Kuo: A Functional Verification Environment for Advanced Switching Architecture. 201-204
Vineetha Kalavally, Tin Win, Malin Premaratne: Crosstalk in Counter-Pumped Distributed Raman Amplifiers with DTDM pumping. 205-209
Haijun Mo, Ping Huang, Shaowei Wu: Study on Dynamic Stability of a Tracked Robot Climbing over an Obstacle or Descending Stairs. 210-213
Francisco Poza, Perfecto Mariño, Santiago Otero, Fernando Machado: Virtual Instrument for Condition Monitoring of On-Load Tap Change. 214-218
Madhu Bhaskaran, Sharath Sriram, Aleksandar Stojcevski, Aladin Zayegh: Design & Simulation of a High Performance Rail-to-Rail CMOS Op-Amp at ± 3V Supply. 219-222
Bassel Soudan: Reducing Inductive Coupling Skew in Wide Global Signal Busses. 223-226
Bruno Girodias, El Mostapha Aboulhamid, Gabriela Nicolescu: A Platform for Refinement of OS Services for Embedded Systems. 227-236
Session 5A: Processor Design and Analysis
Siew Kei Lam, Mohammed Shoaib, Thambipillai Srikanthan: Modeling Arbitrator Delay-Area Dependencies in Customizable Instruction Set Processors. 237-242
Mehdi Modarressi, Shaahin Hessabi, Maziar Goudarzi: A Data Prefetching Mechanism for Object-Oriented Embedded Systems Using Run-Time Profiling. 249-254
Kingshuk Karuri, Christian Huben, Rainer Leupers, Gerd Ascheid, Heinrich Meyr: Memory Access Micro-Profiling for ASIP Design. 255-262
Session 5B: Novel Systems and Applications
Andrew D. Payne, Dale A. Carnegie, Adrian A. Dorrington, Michael J. Cree: Full Field Image Ranger Hardware. 263-268
Maarten Uijt de Haag, Ananth Vadlamani, Jacob L. Campbell, Jeff Dickman: Application of Laser Range Scanner Based Terrain Referenced Navigation Systems for Aircraft Guidance. 269-274
Alex See Kok Bin, Shen Weixiang, Ong Kok Seng, Saravanan Ramanathan, Low I-Wern: Development of a LabVIEW-based test facility for standalone PV systems. 275-280
Session 6A: Innovations in Test
Rochit Rajsuman: Innovation In Test: Where Are We. 289-294
Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre: Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains. 295-300
Tomoyuki Saiki, Hideyuki Ichihara, Tomoo Inoue: A Reconfigurable Embedded Decompressor for Test Compression. 301-308
Session 6B: Special Session on Microphotonics
Chung-Kiak Poh, Kamal Alameh: Improving the Steering Efficiency of 1x4096 Opto-VLSI Processor Using Direct Power Measurement Method. 309-314
Kaveh Sahba, Kamal E. Alameh, Clifton Smith: MicroPhotonic Remote Sensor for Perimeter Security. 315-320
Muhsen Aljada, Kamal Alameh, Khalid Al-Begain: Distributed Wireless Optical Communications for Humanitarian Assistance in Disasters. 321-326
Poster Session 3

Shahram Minaei, Erkan Yüce, Oguzhan Cicekoglu: Lossless Active Floating Inductance Simulator. 332-335
K. S. Sainarayanan, J. V. R. Ravindra, M. B. Srinivas: Minimizing Simultaneous Switching Noise (SSN) using Modified Odd/Even Bus Invert Method. 336-339
Jiri Haze, Radimir Vrba: The New Low Power 10-bit Pipelined ADC Using Novel Background Calibration Technique. 340-344

B. Sokol, S. V. Yarmolik: Address Sequences for March Tests to Detect Pattern Sensitive Faults. 354-360
Session 7A: Special Session on Electromagnetic Sensors & Devices 2
Takahisa Ohji, Masaaki Sato, Kenji Amei, Masaaki Sakui: Analytical Study on a New Induction Type Magnetic Levitation System Creating Quasi-Static Lorentz Forces for a Non-Magnetic Sheet Metal. 361-364
S. C. Mukhopadhyay, C. P. Gooneratne: Comparison of Electromagnetic Response of Planar Interdigital Sensors: Quality Testing of Pork Meat. 365-370
Daming Zhang, K. J. Tseng: Effect of High Permittivity and Core Dimensions on the Permeability Measurement for Mn-Zn Ferrite Cores Used in High-Frequency Transformer. 371-378
Session 7B: BIST and Memory Test
Shibaji Banerjee, Dipanwita Roy Chowdhury: Built-In Self-Test for Flash Memory Embedded in SoC. 379-384
Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic March Tests Generation for Multi-Port SRAMs. 385-392
Poster Session 4
Ashok Sivaji: Measurements System Analysis. 393-396
Haihua Liu, Changsheng Xie, Zhouhui Chen, Yi Lei: Segmentation of Ultrasound Image Based on Morphological Operation and Fuzzy Clustering. 397-400
Donald G. Bailey, K. T. Gribbon, Christopher T. Johnston, Montree Siripruchyanun: GATOS: A Windowing Operating System for FPGAs. 405-409
Montree Siripruchyanun: A Low-Voltage, Low-Power Current-mode Automatic Gain Control (AGC) for Battery-Powered Equipment. 410-413
Himanshu Thapliyal, Anvesh Ramasahayam, Vivek Reddy Kotha, Kunul Gottimukkula, M. B. Srinivas: Modified Montgomery Modular Multiplication Using 4: 2 Compressor and CSA Adder. 414-417
M. Puczko, V. N. Yarmolik: Designing cryptographic key generators with low power consumption. 418-421
P. W. Chandana Prasad, Bruce Mills, Ali Assi, S. M. N. Arosha Senanayake, V. C. Prasad: Evaluation time Estimation for Pass Transistor Logic circuits. 422-428
Session 8A: Special Session on Defect and Fault Tolerance in Electronic Systems
Kok Yew Ng, Chee Pin Tan, Rini Akmeliawati: Tolerance towards sensor failures: an application to a double inverted pendulum. 429-434
Chee Pin Tan, Ye Chow Kuang, Christopher Edwards: Robust sensor fault reconstruction using right eigenstructure assignment. 435-439
Viacheslav Izosimov, Paul Pop, Petru Eles, Zebo Peng: Synthesis of Fault-Tolerant Embedded Systems with Checkpointing and Replication. 440-447
Session 8B: Signal Processing
Donald G. Bailey: Harmonic Distortion Measurement using Spectral Warping. 455-460
Chao-Huang Wei, Hsiang-Chieh Hsiao, Su-Wei Tsai: Design and Implementation of Multi-Channel Bandpass Filter for Embedded System. 461-471
Peter J. Green, Desmond P. Taylor: Implementation of a High Speed Four Transmitter Space-Time Encoder using Field Programmable Gate Array and Parallel Digital Signal Processors. 466-471
Ahmed Elkammar, Norman Scheinberg, Srinivasa Vemuru: Bus Encoding Scheme To Eliminate Unwanted Signal Transitions. 472-480
Session 9A: Design Verification and Concurrent Checking
Adriel Cheng, Atanas N. Parashkevov, Cheng-Chew Lim: Coverage Measurement for Software Application Testing using Partially Ordered Domains and Symbolic Trajectory Evaluation Techniques. 481-487
Abdelaziz Ammari, Régis Leveugle, B. Nicolescu, Yvon Savaria: Evaluation of a Software-Based Error Detection Technique by RT-Level Fault Injection. 488-493
Jae-Kyu Chun, Seok-Hyung Cho: Performance and Stability Testing of MSMQ in the .NET environment.. 494-502
Session 9B: Communications and Networking
Lau Bei Yer, Vineetha Kalavally, Tin Win, Malin Premaratne: Supervisory Signal Transmission in Distributed Raman Amplifiers. 503-506
Tiong Sieh Kiong, Johnny Koh, Mahamod Ismail, Azmi Hassan: Downlink Capacity Improvement of WCDMA System by Using Adaptive Antenna with Novel MDPC Beamforming Technique. 512-518



