15. DDECS 2012: Tallinn, Estonia Jaan Raik , Viera Stopjaková , Heinrich Theodor Vierhaus , Witold A. Pleskacz , Raimund Ubar , Helena Kruus , Maksim Jenihhin (Eds.):
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012.
IEEE 2012, ISBN 978-1-4673-1187-8 Keynote Talks
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Said Hamdioui :
TSV based 3D stacked ICs: Opportunities and challenges.
2
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Andrzej Pfitzner :
Vertical Slit Transistor based Integrated Circuits (VeSTICs).
3
Embedded Tutorials
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Uwe Knöchel :
3D integration: Opportunities, design challenges and approaches.
4
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Georg Hofferek :
Automated synthesis and design-error repair of systems.
6
Poster Session I
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conf/ddecs/BouajilaLZSH12
Processor Architectures
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Analog and RF Desing
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NoC Simulation and Test
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Analog, RF Design and Test
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Fault Tolerance
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Josef Strnadel :
Monitoring-driven HW/SW interrupt overload prevention for embedded real-time systems.
121-126
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Security
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Hans G. Kerkhoff ,
Yong Zhao :
The design of dependable flexible multi-sensory System-on-Chips for security applications.
133-138
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Short Papers I
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Short Papers II
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Poster Session II
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conf/ddecs/WirnshoferHKAGS12 export record as
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ASIC/FPGA Design
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Test Generation and Fault Detection
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conf/ddecs/EggersglussKGHD12 export record as
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Poster Session III
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Jacek Gradzki :
Low power balun Design for 1.575 GHz in 90 nm CMOS rechnology.
250-253
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On-line Test and Self-Repair
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Test and Reliability of Microprocessors
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conf/ddecs/BernardiCGSR12 export record as
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conf/ddecs/AzarpeyvandSF12
Design Verification
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conf/ddecs/GuglielmoGFP12 export record as
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Reliability Challenges in Nano-Scale Technology
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conf/ddecs/MesgarzadehSA12 export record as
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Physical Design
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conf/ddecs/MilovanovicZ12 export record as
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Industrial Papers
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