2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France.
IEEE Computer Society 2002, ISBN 0-7695-1471-5
Plenary - Keynote Session
Hugo De Man: On Nanoscale Integration and Gigascale Complexity in the Post.Com World.
12
Taylor Scanlon: Global Responsibilities in SOC Design.
12
How to Choose Semiconductor IP?
Ian Phillips: How to Choose Semiconductor IP? - Embedded Processor.
14
Vincent Ratford: Make Your SoC Design a Winner: Select the Right Memory IP.
15
Grant Martin: How to Choose Semiconductor IP: Embedded Software.
16
Pierre Bricaud: IP Day: How to Choose Semiconductor IP?
17
Christoph Hoffmann: A New Design Flow and Testability Measure for the Generation of a Structural Test and BIST for Analogue and Mixed-Signal Circuits.
197-204
Goeran Jerke, Jens Lienig: Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits.
464-469
Alex Doboli, Ranga Vemuri: A Functional Specification Notation for Co-Design of Mixed Analog-Digital Systems.
760-767
UML:
Using the Unified Modeling Language for Embedded System Specification
Bran Selic: The Real-Time UML Standard: Definition and Application.
770-772
Grant Martin: UML for Embedded Systems Specification and Design: Motivation and Overview.
773-775
Gjalt G. de Jong: A UML-Based Design Methodology for Real-Time and Embedded Sytems.
776-779
Real-Time Embedded Systems
Gang Quan, Xiaobo Hu: Minimum Energy Fixed-Priority Scheduling for Variable Voltage Processor.
782-787
Woonseok Kim, Jihong Kim, Sang Lyul Min: A Dynamic Voltage Scaling Algorithm for Dynamic-Priority Hard Real-Time Systems Using Slack Time Analysis.
788-794
Peter Petrov, Alex Orailoglu: Power Efficient Embedded Processor Ip's through Application-Specific Tag Compression in Data Caches.
1065-1071
Martin Palkovic, Miguel Miranda, Francky Catthoor: Systematic Power-Performance Trade-Off in MPEG-4 by Means of Selective Function Inlining Steered by Address Optimization Opportunities.
1072-1077
Swarup Bhunia, Kaushik Roy: Fault Detection and Diagnosis Using Wavelet Based Transient Current Analysis.
1118
Jun-Weir Lin, Chung-Len Lee, Jwu E. Chen: An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits.
1119