Geoffrey Charles Fox, Waleed W. Smari (Eds.): 2013 International Conference on Collaboration Technologies and Systems (CTS), San Diego, CA, USA, May 20-24, 2013. IEEE 2013 ISBN 978-1-4673-6403-4 [ contents ]
CTS 2012: Denver, CO, USA
Waleed W. Smari, Geoffrey Charles Fox (Eds.): 2012 International Conference on Collaboration Technologies and Systems, CTS 2012, Denver, CO, USA, May 21-25, 2012. IEEE 2012 ISBN 978-1-4673-1381-0 [ contents ]
CTS 2011: Philadelphia, Pennsylvania, USA
Waleed W. Smari, Geoffrey Fox (Eds.): 2011 International Conference on Collaboration Technologies and Systems, CTS 2011, Philadelphia, Pennsylvania, USA, May 23-27, 2011. IEEE 2011 ISBN 978-1-61284-636-1 [ contents ]
CTS 2010: Chicago, Illinois, USA
Waleed W. Smari, William K. McQuay (Eds.): 2010 International Symposium on Collaborative Technologies and Systems, CTS 2010, Chicago, Illinois, USA, May 17-21, 2010. IEEE 2010 [ contents ]
CTS 2009: Baltimore, Maryland, USA
William K. McQuay, Waleed W. Smari (Eds.): 2009 International Symposium on Collaborative Technologies and Systems, CTS 2009, Baltimore, Maryland, USA, May 18-22, 2009. IEEE 2009 [ contents ]
CTS 2008: Irvine, California, USA
William K. McQuay, Waleed W. Smari (Eds.): 2008 International Symposium on Collaborative Technologies and Systems, CTS 2008, Irvine, California, USA, May 19-23, 2008. IEEE 2008 [ contents ]
CTS 2007: Orlando, Florida, USA
William K. McQuay, Waleed W. Smari (Eds.): 2007 International Symposium on Collaborative Technologies and Systems, CTS 2007, Orlando, Florida, USA, May 21-25, 2007. IEEE 2007 ISBN 0-9785699-1-1 [ contents ]
CTS 2006: Las Vegas, NV, USA
Waleed W. Smari, William K. McQuay (Eds.): 2006 International Symposium on Collaborative Technologies and Systems, CTS 2006, Las Vegas, NV, USA, May 14-17, 2006. IEEE Computer Society 2006 ISBN 0-9785699-0-3 [ contents ]
CTS 2005: Saint Louis, Missouri, USA
William K. McQuay, Waleed W. Smari (Eds.): Proceedings of the 2005 International Symposium on Collaborative Technologies and Systems, CTS 2005, Saint Louis, Missouri, USA, May 15-20, 2005. IEEE 2005 ISBN 0-7695-2387-0 [ contents ]