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4. AutoID 2005: Buffalo, NY, USA

Proceedings of the Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID 2005), 16-18 October 2005, Buffalo, NY, USA. IEEE Computer Society 2005, ISBN 0-7695-2475-3 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML

Introduction

Session I: Biometrics

Session II: RFID - I

Session III: Face Modality

Session IV: Posters

Session V: Invited Talk

Session VI: RFID - II

Session VII: Mixed Modalities - I

Session VIII: Mixed Modalities - II

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