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conf/ats/KavousianosCJP11 export record as
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Dong Xiang ,
Zhen Chen :
Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data.
40-45
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Ozgur Sinanoglu :
Rewind-Support for Peak Capture Power Reduction in Launch-Off-Shift Testing.
78-83
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conf/ats/MiyaseUEYWKWDBGV11 Kohei Miyase ,
Y. Uchinodan ,
Kazunari Enokimoto ,
Yuta Yamato ,
Xiaoqing Wen ,
Seiji Kajihara ,
Fangmei Wu ,
Luigi Dilillo ,
Alberto Bosio ,
Patrick Girard ,
Arnaud Virazel :
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling.
90-95
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Jae Chul Cha ,
Sandeep K. Gupta :
Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates.
126-135
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conf/ats/KhodabandelooHTHBN11 export record as
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Rance Rodrigues ,
Sandip Kundu :
An Online Mechanism to Verify Datapath Execution Using Existing Resources in Chip Multiprocessors.
161-166
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conf/ats/BhattacharyaMSD11 export record as
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conf/ats/SpyronasiosASM11 export record as
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conf/ats/MrugalskiPMRTU11 export record as
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Manuel A. d'Abreu :
Nand Flash Memory - Product Trends, Technology Overview, and Technical Challenges.
463
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Masahiro Fujita :
High Level Verification and Its Use at Pos-Silicon Debugging and Patching.
464-469
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Hidetoshi Onodera :
Dependable VLSI Program in Japan: Program Overview and the Current Status of Dependable VLSI Platform Project.
492-495
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Norbert Wehn :
Reliability: A Cross-Disciplinary and Cross-Layer Approach.
496-497
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